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... Clear visibility promotes new discovery Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of ...
Jeol
... Easy to acquire data for all specimen types The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, ...
Jeol
... operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW（TM） ...
Jeol
... Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; ...
Jeol
... areas with the scanning electron microscope to observe the fine structures at higher magnification & higher resolution.The observation targets found with the optical microscope can be ...
Jeol
... experience for all SEM users. Functions include the SEM automatic adjustment package, a trapezoidal correction function (useful for EBSD measurements) and Live 3D surface reconstruction for observation ...
Jeol
Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm
... The JSM-IT800 incorporates our "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a system ...
Jeol