Nikon Metrology inspection microscopes

1 company | 10 products
{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement5.length}}
polarizing microscope
polarizing microscope
ECLIPSE LV100N POL

Weight: 17 kg
Length: 490 mm
Width: 251 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

See the other products
Nikon Metrology
metallurgical microscope
metallurgical microscope
ECLIPSE MA200

Magnification: 1 unit - 100 unit
Length: 295 mm
Width: 215 mm

... is a flexible, modular, inverted microscope of innovative box design for episcopic optical contrast inspection techniques in conjunction with digital imaging accessories. It is ideal for metallurgical ...

See the other products
Nikon Metrology
optical microscope
optical microscope
Eclipse LV100ND

Weight: 9.5 kg
Length: 362 mm
Width: 251 mm

... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended ...

See the other products
Nikon Metrology
optical microscope
optical microscope
Eclipse Ci-POL

Magnification: 5 unit - 100 unit
Weight: 14 kg
Length: 271 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

See the other products
Nikon Metrology
metallographic microscope
metallographic microscope
Eclipse MA100N

Weight: 10 kg
Length: 552 mm
Width: 229 mm

... affordable, flexible, compact, modular, inverted microscope for episcopic optical contrast techniques in conjunction with digital imaging camera accessories. It is ideal for metallurgical material inspection ...

See the other products
Nikon Metrology
optical microscope
optical microscope
ECLIPSE L300N series

Magnification: 50 unit
Weight: 45 kg

... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...

See the other products
Nikon Metrology
optical microscope
optical microscope
Eclipse L200N series

Weight: 45 kg

... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...

See the other products
Nikon Metrology
optical microscope
optical microscope
Eclipse LV150NA

Weight: 8.7 kg

... modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic ...

See the other products
Nikon Metrology
optical microscope
optical microscope
Eclipse LV150N

Weight: 8.6 kg

... modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic ...

See the other products
Nikon Metrology
optical microscope
optical microscope
Eclipse LV100NDA

Weight: 8.6 kg

... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended ...

See the other products
Nikon Metrology
exhibit your products

& reach your clients in one place, all year round

Exhibit with us