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Inspection microscope Eclipse L200N series
opticaldark fieldfor semiconductors

inspection microscope
inspection microscope
inspection microscope
inspection microscope
inspection microscope
inspection microscope
inspection microscope
inspection microscope
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Characteristics

Technical applications
inspection
Type
optical
Observation technique
dark field
Other characteristics
for semiconductors

Description

Incorporating CFI60 optics for flawless inspection of 200mm wafers and masks. Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with wafer loaders, the L200 series performs exceptionally precise optical inspection of wafers, photo masks, reticles and other substrates. Applications Antennae Telecom & Electronics Wafers Telescope optics Mobile phones, shavers & watches

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.