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Metallographic microscope ECLIPSE MA200
for materials researchindustrialfor production lines

Metallographic microscope - ECLIPSE MA200 - Nikon Metrology - for materials research / industrial / for production lines
Metallographic microscope - ECLIPSE MA200 - Nikon Metrology - for materials research / industrial / for production lines
Metallographic microscope - ECLIPSE MA200 - Nikon Metrology - for materials research / industrial / for production lines - image - 2
Metallographic microscope - ECLIPSE MA200 - Nikon Metrology - for materials research / industrial / for production lines - image - 3
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Characteristics

Type
metallographic
Technical applications
for materials research, industrial, for production lines, for quality control, metallurgical
Ergonomics
inverted
Microscope head
trinocular, Siedentopf type
Quality of the objectives
infinity corrected
Observation technique
differential interference contrast, polarized, DIC, dark field, bright field
Light source
LED illumination
Options and accessories
motorized
Other characteristics
with HD digital camera, digital camera
Weight

25 kg
(55.1 lb)

Length

Min.: 29.5 cm
(11.6 in)

Max.: 29.5 cm
(11.6 in)

Width

21.5 cm
(8.5 in)

Description

Product overview
The ECLIPSE MA200 LED is an inverted metallurgical microscope designed for episcopic optical-contrast inspection combined with digital imaging accessories. It is intended for materials R&D, production inspection and metallurgical quality control in industrial environments, supporting a wide range of sample sizes including resin-mounted cross sections and large components.

Ergonomic design concept
Front-mounted operator controls and a variable-angle eyepiece tube enable fatigue‑reduced operation. The stage accepts multiple aperture plates and a variety of holders; optical sliders support grain sizing and linear measurements. Controls and maintenance access are arranged for efficient laboratory and production workflows.

Grain size and cast iron modules
When used with NIS-Elements software, the system performs grain size analysis compliant with standards (JIS G0551, ASTM E112-13, E1382-97, ISO 643, GB/T 6394). Cast iron analysis detects, measures and classifies graphite according to JIS G5502, ASTM A247-06 and ISO945-1. Results integrate with image capture and measurement routines for traceable reporting.

Key features
  • Digital Sight compatibility: Integrates with Digital Sight cameras and NIS-Elements for high-definition capture, measurement and analysis.
  • Nikon CFI60 / CFI60-2 optics: Objectives with chromatic aberration correction for accurate imaging.
  • Modular accessories: Manual/ motorized nosepieces, selectable LED lamphouses (C-LL-I), stages and polarizing options to match observation methods.

Included / selectable functions and modules
  • Observation techniques: Brightfield, Darkfield, Simple Polarizing, DIC.
  • Optical system compatibility: CFI60 / CFI60-2.
  • Imaging & software: Designed to integrate with Nikon Digital Sight cameras and NIS-Elements for capture, measurement and analysis (grain size, cast iron, etc.).

Technical specifications (excerpt)
  • Model: ECLIPSE MA200 LED
  • Focusing mechanism: Focusing nosepiece (fixed stage). Coaxial coarse/fine adjustment knob with adjustable torque; coarse 4.0 mm/rotation, fine 0.1 mm/rotation.
  • Illumination: C-LL-I LED lamphouse with flare prevention and built-in UV cut filter. Field and aperture diaphragms dial-continuous and centerable. Polarizing block selectable (with/without 1/4 plate).
  • Light distribution: Eyepiece tube / back port: 100/0 or 55/45.
  • Optics: CFI60 / CFI60-2 system.
  • Observation methods: Brightfield / Darkfield / Simple Polarizing / DIC.
  • Resolving nosepieces: MA-N7-I, LV-NU5IN, LV-NU5A (motorized option).
  • Stage: MA2-SR mechanical stage (X/Y flexible handle). Dimension: 295 × 215 mm. Stroke: 50 × 50 mm.
  • Trinocular eyepiece: Seidentopf, interpupillary distance adjustment 50–75 mm.
  • Power input: 100–240 V, 50–60 Hz. Power consumption: 1.2 A / 75 W.
  • Weight: Approx. 25 kg (depends on configuration).
  • Options: Intermediate magnification turret (1×, 1.5×, 2×) with status detection; reticles: MA2-GR grain reticle, grid reticle (20 lines, 0.5 mm), MA2-MR scale reticle (5–100×, µm readout).

Other Nikon Metrology products

Industrial Microscopy

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.