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Inspection microscope Eclipse LV150NA
opticallong working distancemodular

inspection microscope
inspection microscope
inspection microscope
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Characteristics

Technical applications
inspection
Type
optical
Other characteristics
long working distance, modular, for semiconductors

Description

A motorized, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max. sample size: 150 x 150 mm Key benefits Modularized microscope body applicable with various observations and tasks Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body Easy digital imaging

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.