The JEM-2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic electrons is eliminated, resulting in clear images with high contrast. And energy-filtered images forming with electrons at low loss or core loss energy provide chemical state or elemental information of a sample. Also, spectroscopy for elemental analysis and chemical analysis of specimens is available.
Features
• In-column energy filter (Omega filter)
The in-column energy filter enables you to obtain energy-filtered images and electron energy loss spectra. The optimally designed filter provides distortion-free filtered images.
• Control system
The main components of the JEM-2200FS, such as the optical system, goniometer stage and evacuation system, are fully PC-controlled. This system stably produces high-quality data.
• Imaging system
A new imaging system, consisting of four-stage intermediate lenses and two-stage projector lenses, achieves rotation-free energy-filtered TEM images and diffraction patterns over a wide range of magnifications and camera length.
• Piezo-controlled goniometer
A new goniometer stage that incorporates a piezo device offers smooth operation for searching fields of view at the atomic level.
• Integration to other instruments
The microscope can be fully controlled with PC. The design concept enables us to integrate EDS system and CCD cameras.