Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications.
> Combined measurement of surface roughness and form deviation with the all-in-one optical 3D surface metrology Measure surface roughness and form tolerances < The TopMap Pro.Surf+ offers the customized solution for all surface characterization ...
> Fast optical surface inspections right in the production line Surface metrology for in-line measurenment Surface metrology for in-line measurenment Measurements within short cycle times thanks to the latest, high-speed sensor technology > ...
TIME®3234 is a portable stylus surface waviness tester, suitable for testing in workshop, laboratory, metrology center and etc.. It can measure roughness, waviness and primary profile. The test results can be displayed digitally and graphically ...
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