Polished sample microscopes
Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react. With a large field of view, the DM3 XL inspection ...
... development, or in forensics, searching for the detail can take up a lot of your time in microscopy. The Leica DVM6 digital microscope is fast, reliable and easy to use for every user. It is the perfect solution that ...
... delivers the chemical composition of the microstructure that you see in the microscope image – within a second. Speed up your workflow. The LIBS module turns a Leica optical microscope into a 1-step solution ...
Resolution: 5 µm - 110 µm
... conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with least restriction to the sample dimensions. The ...
Resolution: 14 µm - 110 µm
Extend the resolution of your optical microscope The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution ...
Resolution: 100 nm - 6,000,000 nm
... to ISO6506 and ASTM E10. The BRINtronic series of stand alone automatic Brinell microscopes includes: - BRINtronic–LT² fully automatic portable Brinell microscope includes laptop PC supplied ...
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