Product DescriptionPotential Induced Degradation (PID) and bypass-diode thermal testing system for photovoltaic (PV) modules. The system simulates strong electric fields and humid-heat environments, applies controlled positive and negative high voltages to module connectors and frames, and interfaces with environmental chambers for combined temperature and humidity stress. Designed for laboratory and production-line qualification of crystalline silicon PV modules.
Test Standards- IEC61215-2: 2021 MQT 21 Potential Induced Degradation Test
- IEC 62804-1-1:2020 Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation Part 1-1 Crystalline silicon – Delamination
- IEC 63209:2019 Extended-stress testing of photovoltaic modules
Product SpecificationsModel: 8086-HD
DC regulated power supply: 12 independent channels with monitoring and control; each channel can independently control voltage polarity
Voltage range: -2000V to 2000V
Voltage resolution: 1V
Voltage stability: For continuous outputs of 1000V, 1500V, and 2000V, voltage fluctuation is ≤2% within 500 hours
Connection method: Module frame grounded, connector shorted then connected to high-voltage terminal. For negative-voltage testing and positive-voltage recovery, polarity switching is performed without changing connections
Voltage accuracy: ±3% (referencing CNAS-CL01-A021:2018)
Voltage tolerance: 0.5% (referencing IEC 62804-1-1:2020)
Current measurement range: 0–1 mA; resolution: 0.01 μA (as specified in IEC 62804-1-1:2020)
Acquisition interval: ≤5 minutes (software adjustable)
Safety protection: Overcurrent alarm, overvoltage alarm, overtemperature alarm; communication interface to environmental test chamber
Power: Single phase, 220V, 50Hz
Product Advantages- Quality assurance: collaboration with specialized suppliers and in-process quality oversight
- Cost efficiency: market-aware pricing to optimize total cost of ownership
- QC team: inspection during production and pre-shipment checks according to AQL standards
- Laboratory-ready design: professional enclosure and integration provisions for test benches and racks
Technical Specifications- Model: 8086-HD
- Channels: 12 independent DC regulated power channels
- Voltage range: -2000V to 2000V
- Voltage resolution: 1V
- Voltage stability: ≤2% fluctuation for continuous outputs (1000/1500/2000V) within 500 hours
- Voltage accuracy: ±3% (CNAS-CL01-A021:2018)
- Voltage tolerance: 0.5% (IEC 62804-1-1:2020)
- Current measurement range: 0–1 mA; resolution 0.01 μA
- Acquisition interval: ≤5 minutes (software adjustable)
- Safety protections: Overcurrent, overvoltage, overtemperature alarms; communication interface to environmental test chamber
- Power: Single phase, 220V, 50Hz