Voltage measuring instrument 25 series

currentlaser diodedigital

Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively. 2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test. TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler. Active temperature control - Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. 50W TEC Controller - Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. Fully digital P-I-D control - Provides greater temperature stability and can be easily upgraded with a simple firmware change. Autotuning capability for the thermal control loop (2510-AT) - Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) - Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors - Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. AC Ohms measurement function - Verifies the integrity of the TEC device.