Single-channel source measure unit 2400

GPIBhigh-precision4-quadrant

Overview
Keithley’s 2400 Standard Series Source Measure Unit (SMU) combines a four-quadrant precision voltage and current source/load with instrument-grade measurement. Each unit functions as a stable DC power source and a 6½-digit multimeter, delivering low noise, high repeatability and precise readback.

Highlights

• Precision SMU for I‑V characterization of semiconductors, sensors and materials
• Can source voltage or current and measure both simultaneously
• Compact single-channel design for benchtop and rack integration

Built-in sweep capabilities

• Linear staircase sweeps
• Logarithmic staircase sweeps
• Custom sweep profiles for automated characterization

Integrate with switching systems

• Pair with Keithley switch systems for fast, multipoint testing
• Typical applications: semiconductor devices, circuit protection components, optoelectronic tests, accelerated stress testing

Education and lab use

• Combines multiple instrument functions for teaching Ohm's Law and I‑V measurement
• Suitable for undergraduate/graduate labs and R&D benches

Models (table)
Columns: Model / Touchscreen / Channels / Max Current / Max Voltage / Resolution (Current / Voltage) / Power / List Price
2401. — No — 1 — 1 A — 20 V — 1 pA / 100 nV — 20 W — US $6,380
2400 — No — 1 — 1 A — 200 V — 1 pA / 100 nV — 20 W — US $10,000
2410. — No — 1 — 1 A — 1100 V — 1 pA / 100 nV — 20 W — US $18,200

Software & resources
KickStart instrument control software enables I‑V characterization without programming and export of results. Firmware updates, CAD models, detailed specifications and application notes are available for system integration.

Technical specifications

• Max power envelope (series): 60 W DC
• Voltage range (series): 100 nV to 1100 V
• Current range (series): 1 pA to 5 A (model/option dependent)
• Measurement resolution: 1 pA / 100 nV
• Basic accuracy: 0.012% (6.5 digits)
• Max speed: up to 2000 readings/s to buffer
• Interface: GPIB, USB, Ethernet (depending on configuration)
• Typical applications: I‑V characterization, production testing, teaching and R&D