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1. Surface contour evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross section, and determine the points, each intersectant point, coordinate axis, straight line, vertical line, circle and circular cross section, and ...
Chotest Technology Inc.
The SJ5720-OPT series is a capable to measure both surface roughness and profile after once scanning. Moreover, there is a dedicated software module for measurement and analysis of large aspheric surface, so this series is an ideal measurement solution ...
Chotest Technology Inc.
... SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning ...
Chotest Technology Inc.
... SuperView W3 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning ...
Chotest Technology Inc.
... Nano 3D Optical Surface Profilometers SuperView W1 Model No.: SuperView W1/W1-Pro Product name: Nano 3D Optical Surface Profilometers Standard field of view: (0.98*0.98)mm Max field of view: (6x6)mm Reflectivity ...
Chotest Technology Inc.
... 1. Once Scanning for both Profile and Roughness parameters such as Ra and Pt 2. Surface roughness: R parameter, P parameter, W parameter, etc. 3. Surface profile evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross ...
Chotest Technology Inc.
SJ5780-200 Bidirectional scanning contour measuring instrument is a large-range, high-precision active scanning comprehensive contour measuring instrument. The instrument X-axis, Z-axis with independent motion system, the use of advanced two-axis linkage ...
Chotest Technology Inc.
SJ5780-300 Bidirectional scanning contour measuring instrument is a large-range, high-precision active scanning comprehensive contour measuring instrument. The instrument X-axis, Z-axis with independent motion system, the use of advanced two-axis linkage ...
Chotest Technology Inc.
SJ5780-400 Bidirectional scanning contour measuring instrument is a large-range, high-precision active scanning comprehensive contour measuring instrument. The instrument X-axis, Z-axis with independent motion system, the use of advanced two-axis linkage ...
Chotest Technology Inc.
... SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning ...
Chotest Technology Inc.