Geology microscopes

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optical microscope
optical microscope
ECLIPSE LV100N POL

Magnification: 4 unit - 100 unit
Weight: 17, 14 kg

... Product overview
The ECLIPSE LV100N POL LED and Ci-POL are polarizing microscopes designed for observation and analysis of birefringent anisotropic specimens. Nikon CFI60-POL optics support qualitative and quantitative polarizing ...

high-speed microscope
high-speed microscope
AM73915MZTL

Magnification: 10 unit - 140 unit
Weight: 110 g
Length: 11.9 cm

... The Dino-Lite AM73915MZTL is a Long Working Distance model that is part of the High Speed range with USB 3.0 connection. It offers superb uncompressed image quality and color reproduction in a robust, compact and appealing metal housing. USB 3.0 adds ...

digital microscope
digital microscope
iVideo-106

Magnification: 15.5 unit - 100 unit

... micro images on a larger screen; ●SD card storage (32G) ●Zoology, botany, entomology, histology, mineralogy, archaeology, geology and dermatology; ●In the textile industry, used for the inspection of raw materials and cotton fabric; ●In ...

tungsten filament microscope
tungsten filament microscope
SEM 3300

Magnification: 1 unit - 300,000 unit
Resolution: 2.5 nm - 5 nm
Length: 926 mm

... CIQTEK SEM3300 SEM Microscope Specifications *Electron Optics Resolution: 2.5 nm @ 15 kV, SE 4 nm @ 3 kV, SE 5 nm @ 1 kV, SE Accelerating Voltage: 0.1 kV ~ 30 kV Magnification ...

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CIQTEK Co., Ltd.
field emission scanning electron microscope
field emission scanning electron microscope
HEM6000

Magnification: 66 unit - 1,000,000 unit
Resolution: 1.3 nm
Length: 1,716 mm

... High-speed scanning electron microscope for cross-scale imaging of large-volume specimens CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, ...

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CIQTEK Co., Ltd.
field emission scanning electron microscope
field emission scanning electron microscope
SEM4000X

Magnification: 1,000,000 unit
Resolution: 0.9, 1.2, 1.9 nm

... CIQTEK SEM4000X FESEM Microscope Specifications Electron Optics - Resolution: 0.9 nm@ 30 kV, SE 1.2 nm@15 kV, SE 1.9 nm@1 kV, SE 1.5 nm@1 kV (Ultra beam deceleration) ...

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CIQTEK Co., Ltd.
optical microscope
optical microscope
NK-107 series

... 1.45°inclined and 360°rotatable head with the reasonable system for easily viewing. 2. Eyepiece:WF10×(Optional:WF16×) 4.Working distance:8mm 5.Field illumination 220V or110V/6V20W 6.Products are applicable to medical research, geological analysis, ...

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