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Resolution: 0.7, 1, 0.6 nm
... of nanomaterials with sub-nanometer resolution and high material contrast. Verios 5 XHR Scanning Electron Microscope The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range ...
... fitted on microscopes, and are compatible with a wide range of microscopes and other optical systems. This cost efficient solution for slim adjustment on the microscope. It is extremely easy to connect ...
Resolution: 0.02 µm
... Product overview
The Atomic Force
Microscope (wafer-level AFM) is a high-resolution scanning probe instrument designed to characterize three-dimensional surface morphology and multifunctional properties of conductors, semiconductors ...
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