IGBT Dynamic Test System is composed of high precision programmable DC power supply, fixture unit, sampling & control unit, drive unit, protection unit, and supporting measuring instruments. With software independently developed by Kewell, the system provides a stable and precise platform to test the dynamic characteristics of IGBT.
Functions
Turn-on test (Pon, Eon)
Turn-off test (Poff, Eoff)
Reverse recovery properties of diode
Short-circuit characteristics
Gate-charge QG test
Product Advantages
Versatile test functions: single pulse test, double pulse test, and short-circuit test.
Process capability of low stray inductance.
Overcurrent protection and quick current-off capability.
High measurement accuracy.
Wide voltage output and multi-grade inductive load. Satisfy the diverse requirements of dynamic testing.
Real-time monitoring function, and data logging & analysis functions.
Test work-step and protection variables can be adjust online.
.Turn-on test (Pon, Eon)
.Turn-off test (Poff, Eoff)
.Reverse recovery characteristics of diode