Laboratory test system MX710D SiC

for semiconductorson siteprecision

Product overview
MX710D series SiC laboratory dynamic test system comprises a high-precision programmable DC power supply, fixture unit, measurement & control unit, driver control unit, protection unit and supporting test instruments. It uses the company's proprietary system test software to provide a stable and accurate platform for dynamic parameter testing of SiC devices, covering turn-on, turn-off, diode reverse-recovery and short-circuit characteristics.

Key features

• Designed for laboratory use with comprehensive test functions; supports single-pulse, double-pulse and short-circuit tests;
• Equipped with overcurrent protection to rapidly open the current loop in case of device failure;
• Extremely low parasitic inductance through compact design to meet SiC high-speed switching tests;
• High compatibility: configurable for various devices, modules and circuits via matched equipment and test fixtures;
• User-friendly HMI for straightforward operation.

Product interface / Images
(Page provides multiple demo image placeholders; actual page displays product diagrams and interface screenshots)

Application scope
Suitable for laboratories testing dynamic characteristics of silicon carbide (SiC) power devices, for parameter verification and R&D.

Characteristics / Technical specifications (summary)

• Model: MX710D series;
• Applicable devices: SiC (silicon carbide) power devices;
• System components: programmable DC power supply, fixture unit, measurement & control unit, driver control unit, protection unit and supporting test instruments;
• Supported test types: turn-on, turn-off, diode reverse-recovery, short-circuit; supports single- and double-pulse testing;
• Protection: overcurrent protection with fast loop interruption;
• Design requirement: low parasitic inductance to meet high-speed switching tests of SiC devices;
• Software: company-developed system test software and HMI.