Test system on site MX700D SiC

precision

Product overview
MX700D SiC dynamic test system comprises a high-precision programmable DC power supply, fixture unit, measurement and control unit, driver control unit, protection unit and auxiliary test instruments. It uses the manufacturer's in-house system test software to provide a stable and accurate test platform for dynamic characteristic parameters of SiC devices.

Key features

• Comprehensive test capabilities: supports single-pulse, double-pulse, short-circuit and fault charging tests;
• Overcurrent protection: rapidly opens the current loop upon device failure to protect the DUT and system;
• Very low series inductance: compact loop design minimizes series inductance to meet SiC dynamic test requirements;
• High compatibility: supports various packages and circuits by matching different test fixtures;
• Multiple independent driver units: ensures consistency across channels during multi-unit tests;
• User-friendly HMI: intuitive interface for straightforward operation.

Specifications / Technical details

• Model: MX700D (SiC dynamic test system)
• Modules: programmable DC power supply, fixture unit, measurement & control unit, driver control unit, protection unit and auxiliary test instruments
• Supported test types: single-pulse, double-pulse, short-circuit test, fault charging test
• Protection: overcurrent protection that quickly interrupts the current loop on device failure
• Loop characteristic: low series inductance design suitable for SiC dynamic testing
• Compatibility: supports multiple packages and circuits via interchangeable/matched test fixtures
• Drive: multiple independent driver channels to ensure channel-to-channel consistency
• Software: in-house developed system test software providing a stable and accurate testing platform