Hall effect measurement system Dexinmag

resistivitymagneticautomatic

What is the Hall effect Measurement System used to measure?
The hall effect measurement system is used to measure the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magnetoresistance, etc. of Hall elements.


Testable materials of hall effect measurement system:
Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials, etc.
Low impedance material: metal, transparent oxide, weak magnetic semiconductor materials, TMR material, etc.
High impedance material: Semi-insulating GaAs, GaN, CdTe, etc.


The components of DX hall effect measurement instrument:
The Hall effect instrument system consists of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, high and low-temperature controller, standard sample, and system software.


The parameters of DX hall effect measurement equipment:
Carrier concentration: 10³cm⁻³ - 10²³cm⁻³
Mobility: 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec
Resistivity range: 10⁻⁷ Ohm*cm - 10¹² Ohm*cm
Hall voltage: 1 uV - 3V
Hall coefficient: 10⁻⁵ - 10²⁷cm³/ C
Current source: 50.00nA- 50.00mA
Current source resolution: 0.0001uA
Measuring voltage: 0 ~ ±3V
Voltage measurement resolution: 0.0001 mV
One-button automatic measurement can be performed without the need for human operation after the test is started.
Software can perform I-V curve and BV curve.
Set in software for automatic temperature measurement.
The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.
Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set