Hall effect measurement system DX

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What is the Hall effect Measurement System used to measure? The hall effect measurement system is used to measure the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magnetoresistance, etc. of Hall elements. Working Principle of hall effect measurement system: The Hall effect is the production of a potential difference (the Hall voltage) across an electrical conductor that is transverse to an electric current in the conductor and to an applied magnetic field perpendicular to the current. It was discovered by Edwin Hall in 1879. The essence of the Hall effect: When the carriers in the solid material move in the applied magnetic field, the trajectory shifts due to the Lorentz force, and charge accumulation occurs on both sides of the material, forming an electric field perpendicular to the current direction; Finally, the Lorentz force of the carrier is balanced with the electric field repulsion, thus establishing a stable potential difference on both sides, that namely the Hall voltage. Testable materials of hall effect measurement system: Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials, etc. Low impedance material: metal, transparent oxide, weak magnetic semiconductor materials, TMR material, etc. High impedance material: Semi-insulating GaAs, GaN, CdTe, etc. The components of DX hall effect measurement instrument: The Hall effect instrument system consists of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, high and low-temperature controller, standard sample, and system software.