- Metrology - Laboratory
- Metrology and Test Equipment
- Resistance measuring system
- Xiamen Dexing Magnet Tech. Co., Ltd.
Resistance measurement system DX-9000 seriesresistivityHall effectconductivity
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Characteristics
- Measured physical value
- resistivity, resistance, Hall effect
- Technology
- magnetic, conductivity
- Operating mode
- automated
- Measured material
- for semiconductors, for magnetostrictive materials
- Applications
- for industrial applications, laboratory, for component testing
- Other characteristics
- configurable
Description
Overview
Functions
Main Features
Available configurations and key capabilities
Technical specifications
- The DX-9000 series is a fully automated electrical transport property measurement system for characterizing Hall effect, magnetoresistance (R–H), temperature-dependent resistance (R–T) and I–V characteristics. It integrates precision measurement instruments (e.g., Keithley), selectable magnetic field sources (electromagnets or liquid-helium-free superconducting magnets), configurable sample holders and automated testing software for repeatable measurements.
Functions
- Measure Hall effect, R–H characteristics (resistance vs magnetic field), R–T characteristics (resistance vs temperature) and I–V characteristics (resistivity).
- Derive parameters: sheet resistance, resistivity, Hall coefficient, Hall mobility, carrier concentration and conductivity type.
- Generate characteristic outputs: temperature- or magnetic-field-dependent parameter curves; I–V curves under varied fields and temperatures; R–H and R–T plots for data analysis and reporting.
Main Features
- Measurements for resistivity, Hall coefficient and Hall mobility comply with ASTM-F76 standard.
- Wide resistance and resistivity measurement ranges depending on configuration (from ultra-low ~100 nΩ to high resistance up to 100 GΩ in specific configurations).
- Plug-in sample card with provided four-probe card to simplify sample mounting and reduce electrode preparation time.
- Standard configuration supports simultaneous measurement of two samples; optional expansion supports four samples.
- Automated measurement sequences and calculation via dedicated software; a typical Hall-effect dataset can be obtained in approximately 3 minutes.
- Highly stable magnetic field (24-hour stability < ±0.5 G) with smooth zero crossing; electromagnet power supply includes integrated gauss meter and fine control (0.1 G resolution; example ramp 0→1 kG in ~20 s).
- Selectable temperature control options enable Hall and resistance measurements over wide temperature ranges.
Available configurations and key capabilities
- Standard systems (models): DX-9003, DX-9005, DX-9007 — mobility up to ~1×10^5 cm^2/Vs; carrier concentration range ~6×10^12 to 6×10^21 cm^-3; resistivity range 5×10^-7 to 5×10^2 Ω·cm.
- High-sensitivity systems (models): DX-9003HS, DX-9005HS, DX-9007HS — mobility up to ~1×10^6 cm^2/Vs; carrier concentration up to ~6×10^23 cm^-3; resistivity down to ~5×10^-9 Ω·cm.
- High-resistance systems (models): DX-9003HR, DX-9005HR, DX-9007HR — carrier concentration range extending to ~6×10^8 up to ~6×10^23 cm^-3; resistivity up to ~5×10^6 Ω·cm; resistance measurement up to 10 GΩ.
- Temperature environment options: single-point liquid-nitrogen box (77 K); liquid-nitrogen thermostats (standard 80–325 K; high-temp 80–500 K); circulation refrigerators (4 K–325 K or 10 K–325 K); high-temperature furnace (325 K–1000 K).
- Magnetic field environments: room-temperature electromagnets (examples: 1 T @10 mm spacing; 2.4 T @10 mm; 2.6 T @10 mm depending on model); variable-temperature cryostats (examples: 0.44 T @ LN2 up to 2.0 T @ LN2 depending on model; 0.26–1.5 T for closed-cycle refrigerators depending on type).
- Optional components: liquid-helium-free superconducting cryogenic platforms (CFMS series, 5 T–18 T, 1.6 K–400 K), optical accessories (polar head pole, light-shielding box with optical path), rotating sample stage, vacuum pump, circulating water cooling unit and additional temperature/magnetic options.
Technical specifications
- Series / models: DX-9000 series (Standard, HS, HR variants: DX-9003/9005/9007; DX-9003HS/9005HS/9007HS; DX-9003HR/9005HR/9007HR).
- Measured properties: Hall effect, magnetoresistance (R–H), temperature-dependent resistance (R–T), I–V characteristics.
- Derived parameters: sheet resistance, resistivity, Hall coefficient, Hall mobility, carrier concentration, conductivity type.
- Resistance measurement ranges (by configuration): Standard ~10 mΩ – 10 MΩ; High-sensitivity ~0.1 mΩ – 10 mΩ (low-resistance option 100 nΩ – 10 mΩ); High-resistance 0.1 mΩ – 10 GΩ.
- Current source capability: Standard/HS ±50 pA – ±1.05 A (examples: ±1.05 A @ ±21 V, ±105 mA @ ±210 V); HR ±0.1 pA – ±0.1 A; measurement resolution: HS/Standard down to 10 pA / HR down to 10 fA.
- Voltage source / measurement ranges and resolutions (examples): Standard resolution 0.1 μV min (±0.1 μV – ±200 V); HS ±1 nV – ±100 V; HR ±1 nV – ±100 V.
- Resistivity measurement ranges: Standard 5×10^-7 – 5×10^2 Ω·cm; HS 5×10^-9 – 5×10^2 Ω·cm; HR 5×10^-9 – 5×10^6 Ω·cm.
- Mobility ranges: Standard up to ~1×10^5 cm^2/Vs; HS/HR up to ~1×10^6 cm^2/Vs (model dependent).
- Carrier concentration ranges: Standard ~6×10^12 – 6×10^21 cm^-3; HS up to ~6×10^23 cm^-3; HR from ~6×10^8 – 6×10^23 cm^-3 (model dependent).
- Magnetic field stability: 24-hour stability < ±0.5 G; integrated gauss meter and fine control; smooth zero crossing.
- Maximum sample sizes (examples by variant): 10 × 10 × 3 mm; 30 × 30 × 3 mm; 50 × 50 × 3 mm.
- Number of samples measured simultaneously: Standard 2 (expandable to 4); HS/HR typical single-sample high-sensitivity/high-resistance configurations.
- Typical installation footprint (examples): 2 m × 1.5 m; 5 m × 2 m (depending on configuration).
- Test accuracy note: under stated assumptions (100 nm sample thickness, 10,000 Gauss field, correction coefficient 1): resistance test accuracy ~2%; resistivity, Hall coefficient, carrier concentration and mobility test accuracy ~5%.
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Hall Effect Measurement System
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