Hall effect measurement system DX-70

concentricityresistivityfor semiconductors

DX-70 Hall Measurement System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices and the electrical properties of semiconductor materials. DX-70 Hall Effect measurement system consists of an electromagnet, electromagnet power supply, high-precision constant current source, high-precision voltmeter, matrix card, Hall effect sample holder, standard sample, and system software. This HMS system test uses the latest KEITHLEY imported test source meter, combined with the matching low-latency and high-bandwidth matrix card, which greatly improves the range and accuracy of the sample's power supply current and the test sample's Hall voltage. The wide current power supply and The wide voltage test range can cover most of the semiconductor devices on the market. The experimental results are automatically calculated by the software, and parameters such as Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, and Magnetoresistance can be obtained at the same time.