Hall effect test system DX-300

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The DX-300 Automatic Hall Effect Test System is an electromagnetic, fully automatic measurement platform for characterizing semiconductor and conductive materials, providing electrical and magneto-transport parameters via automated Van der Pauw / Hall measurements and data analysis.

Main features

• Automatic result calculation: bulk and surface carrier concentration, mobility, resistivity, Hall coefficient, magnetoresistance, etc.
• Integrated hardware: electromagnet and power supply, high-precision constant current source, high-precision voltmeter, System SourceMeter, matrix card, Hall sample holder, 3D micro-probe station, video microscope, standard samples.
• One-key automatic measurement with automated Van der Pauw switching (built-in four-phase array card) for unattended and repeatable cycle testing.
• Host software: sample parameter setup, I-V and B-V curves, modular design, optional temperature control, data saving and Excel export.

System composition / Configuration summary

• DXSBV-100 electromagnet (vertical field)
• DX-320 System SourceMeter (source/measure instrument)
• DX-150 Gauss meter
• DX-F2030 high-precision linear constant-current power supply
• Three-dimensional micro-motion platform with tungsten steel gold‑plated pressure needles (multiple specifications)
• Video microscope (4K HD camera + display) and HD camera
• Probe bracket, serial cables, power cords, accessory box (including ohmic contact kit), system software and manual, laptop and standard cabinet.

Component introductions (highlights)

• Electromagnet (DXSBV-100): double-yoke vertical structure, adjustable air gap 0–55 mm; pole diameter ~95–100 mm; central magnetic field ≥1 T at 20 mm gap; natural cooling; coil surface temperature rise <40°C after 30 min at 1 T; requires ~1.0 kW DC supply; total weight ≈300 kg.
• Constant current power supply (DX-F2030): 0–100 V DC effective output (open-circuit ~120 V ±8 V @ 10 A); output current −10 A to +10 A; high resolution and stability; RS-232 control for polarity switching and automation; protections for over-temperature, over-current and over-power.
• System SourceMeter (DX-320): current output resolution 0.0001 µA, current range 50.00 nA–50.00 mA, measurement voltage 0–±3 V; built-in automatic Van der Pauw array card for automated measurements.
• 3D micro-motion platform + pressure needles: 4 probe holders; adjustment accuracy 10 µm; applicable probe diameter ≤1 mm; probe tip options 5 µm, 20 µm, 50 µm; tungsten steel gold‑plated needles.
• Video microscope: 4K HD camera with 24" display, magnification 21–135×, HDMI output, built-in LED illumination, measurement and imaging functions.

Testable materials & scope

• Semiconductors: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe, ferrites, etc.
• Low-resistance materials: graphene, metals, transparent oxides, weakly magnetic semiconductors, TMR materials, etc.
• High-resistance materials: semi-insulating GaAs, GaN, CdTe, etc.
• Conductivity types: supports both p-type and n-type testing.

Magnetic field environment (summary)

• Magnet type: variable-field electromagnet (custom sizes available).
• Example central fields by pole spacing: 1070 mT (20 mm), 678 mT (30 mm), 500 mT (40 mm), 378 mT (50 mm), 293 mT (60 mm).
• Hall test field: at 20 mm pole spacing central field >1 T.
• Uniform area: ~1%.
• Field stability: at 5000 Gs, 24‑hour fluctuation <0.3 Gs.

Electrical measurement parameters (summary)

• Current source range: 50.00 nA – 50.00 mA.
• Current resolution: 0.0001 µA.
• Measurement voltage: 0 – ±3 V.
• Voltage resolution: 0.0001 mV.

Other accessories & test bench

• Supported sample size: up to 6 inches.
• Example cabinet dimensions: 600 × 600 × 1000 mm.
• Standard test pieces: supplied Hall-effect standard samples (Si, ITO, GaAs) for verification.
• Ohmic contact tools: soldering iron, indium chips/sheet, solder, enameled wire, etc.

Characteristics / Technical specifications

• Carrier concentration range: ~10^3 cm⁻³ – 10^23 cm⁻³.
• Mobility range: ~0.1 cm²/(V·s) – 10^8 cm²/(V·s).
• Resistivity range: 10⁻5 Ω·cm – 10^7 Ω·cm.
• Hall voltage measurement range: 0.01 µV – ±3 V.
• Hall coefficient range: 10⁻5 – 10^27 cm³/C.
• Test method: Van der Pauw for Hall measurements.
• Repeatability: three-measurement repeatability <3% (manufacturer test samples provided).
• Sample handling: four-probe pressure contact on sample stage fixed to magnet bracket for repeatable positioning.