Hall effect measurement system DX-50

resistivitycarrier concentrationfor semiconductors

DX-50 Hall Effect Measurement System


DX-50 Hall Effect Measurement System is a necessary tool for understanding and studying the electrical properties of semiconductor devices and semiconductor materials.


The hall measurement system consists of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, standard sample and system software.


The Hall effect system is used to measure important parameters such as carrier concentration, mobility, resistivity, Hall coefficient and other important parameters. These parameters are necessary to understand the electrical properties of semiconductor materials.


The DX-320 effect meter specially developed for this instrument system assembles a constant current source and a switch (a six-and-a-half microvoltmeter and a Hall-complex switching relay) into one. Greatly reduced the connection and operation of the experiment. The DX-320 can be used alone as a constant stream and a microvolt.


Parameters of Hall effect measurement system:


Physical parameters
Carrier concentration: 10³cm⁻³ - 10²³cm⁻³
Mobility: 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec
Resistivity range: 10⁻⁷ Ohm*cm - 10¹² Ohm*cm
Hall voltage: 1 uV - 3V
Hall coefficient: 10⁻⁵ - 10²⁷cm³/ C


Magnetic field environment
Magnet Type: Variable electromagnet
Magnitude of magnetic field:
1070mT (The pole pitch is 10mm)
687mT (The pole pitch is 20mm)
500mT (The pole pitch is 30mm)
378mT (The pole pitch is 40mm)
293mT (The pole pitch is 50mm)
Uniform area: 1%
Optional magnetic environment: The electromagnet of relevant magnetic size can be customized according to the needs of customers


Electrical parameters
Current source: 50.00nA- 50.00mA
Current source resolution: 0.0001uA
Measuring voltage: 0 ~ ±3V
Voltage measurement resolution: 0.0001 mV