{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
... product quality“ of G&C device* Once a wafer of up to 200 mm in size has been transported automatically, CT1000 moves precisely to the critical pattern position, or the defect position detected by the defect inspection ...
... model • Contribute to the N3-Generation device development by advanced defect review and analysis function for unpatterned wafers • Improved defect classification performance and accuracy remarkably by adopting AI based ...
... throughput inspection Applications • For device manufacturer: incoming inspection and process tool monitoring use • For tool and material manufacturer: process and material evaluation use • For ...
Incident light microscope for wafer inspection granite base in portal design incident light tube with lens turret vacuum waferchuck
... : high-throughput thickness measurement by XRR and XRF, low-contamination wafer handling and pattern recognition-based position control for product wafer measurements, CE Marking and ...
29xx Broadband Plasma Patterned Wafer Defect Inspection Systems The 295x Series broadband plasma defect inspection systems provide advancements in optical defect inspection, ...
KLA - TENCOR
... is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300iSA delivers ...
The Firefly inspection series provides an automated inspection solution for high performance applications like FPGA, CPU/GPU and networking servers in addition to applications with low I/O counts: IC ...
Onto Innovation Inc.
Ball AOI / Bump AOI Prodcut Presentation Particle inspection equipment MRD-3100 series for COG, FOG, and COF products, particularly for the binding defect detection of LCD display module. Leading ...
Please specify:
Help us improve:
remaining