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Features:
EDX 3600B is the most powerful EDX XRF for testing precious metals such as precious metal (Au, Ag Pt, Pd, etc), steel, alloy, mining and cement analysis, and also for plating thickness analysis and full element analysis and RoHS testing.
Specification:
Metals Range: from sodium (Na) to Uranium (U)
Content ration range: 0.1%---99.99%
Accuracy: 0.05% (for samples whose contents are more than 96%)
Rohs testing: can reach 1ppm for harzardous substances (Cd/ Pb/ Cr/ Hg/ Br/) restricted in RoHS directive.
Plating thickness measurement: plating thickness can be as thin as 10nm and multi-layer can be of more than 5 layers.
Precision of plating thickness: 10nm
Measurement substance: solid, powder and liquid
Measurement time: 60---300 seconds
Detect source: X-ray tube
Working voltage: AC 110/ 220 V
Voltage generator: 5-50 kV
Tube current: (50-1000) µA
Relative humidity: ≤70％
Power: 200W
Configuration:
3-D super-large sample chamber: 160X160mmX180mm
Amplifier circuits
Si PIN semiconductor detector
X-ray tube: Tungsten target material
High and low voltage power supplies
Automatic filter switching system
Automatic collimator switching system
Triple safety protection mode
Arbitrary optional analysis and identification models
CCD Camera: 1.4 million pixels CCD camera
Unique light path enhancement system
Applicable software: Precious metal analysis software, full element analysis software and plating thickness software, RoHS software.
Collimator:Φ8, 6, 4, 3, 2, 1, 0.5, 0.1(mm)
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In-line analysis for the photovoltaic industry
The FISCHERSCOPE® X-RAY Conti 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The Conti 5000 series measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The Conti 5000 series measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
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Lab-X3500 is a compact, reliable, affordable and easy to use XRF analyser. For those in the Petroleum sector the Lab-X3500 conforms to ASTM D4294, ISO20847, ISO8754 and IP336. In addition Oxford Instruments’ offers the
Lab-X3500S/Cl model using air path thereby avoiding the requirement for helium purge. For wood treatment, liquids and powders are measured with equal ease for Copper Chrome Arsenic (CCA), Copper and many others.
Our customers in the cement, minerals, mining and plastics industries all appreciate and benefit from XRF analysis delivered by such a small, compact package providing 24/7 peace of mind and ease of use by production staff.
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Feature:
WDX200 is a Wave Length Dispersive X-Ray Fluorescence Spectrometer widely used in Cement, Steel, and Mine production Quality control. It is optional for testing 10 elements from Na-U, it is said a Cement testing tool since the excellent performance for light elements as Na, Al, K, Ca, Mg, Fe, Si, P.
Specification:
The highest vacuum: < 5 Pa.
Stability: ¡¾ 0.003 KPa
Voltage & tube current stability: better than 0.05 % in12-hour
Measurable elements: 10 arbitrary elements from Na to U.
AC110/220V power supply: 1KVA AC purified stabilized voltage power supply
Analysis accuracy: (24 hours, per cent) ¡Â0.05 £¥.
Test time of single sample: ¡Â3 £ 5 minutes £¨including the time of changing the sample and pumping the vacuum£©
Temperature control accuracy of constant temperature chamber: setting value ¡¾0.1¨¬C.
Configuration
X-ray tube: 200W thin Be end window X-ray tube made by Varian company. Rh anode (optional). 400W(optional).
High voltage supply: 200W (50KV4mA)
Detector: gas proportional detector plus sealed proportional detector; 10 paths of 1024-channel independent pulse height analyzer
Vacuum system: independent pumping station is easy for maintenance.
Analysis software:
Empirical coefficient and theoretical a-coefficient method
TCP / IP protocol (Socket based S/ C) and OPC protocol (OPC server) enable data sharing with DCS or QCS system. RS-232 serial communication protocol
All-spectrum detection technique, all-round self-diagnosis measures
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The SPECTRO XEPOS can be delivered with pre-installed application packages. The application packages are a combination of hardware and analytical methods; installed in the factory and individually tuned.
The range of applications includes, among others: The analysis of waste, soils, sewage sludge, additives in oil, cement, slag, refractories and electronic components and parts in compliance with RoHS, making the SPECTRO XEPOS a true multi-talent.
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The sensitivity, precision and speed of an analytical instrument are of particular importance for industrial process control applications. The SPECTRO iQ already set standards in this respect. The new SPECTRO iQ II maintains this course with further improved technologies and a consequent alignment towards simplicity and dependability of operation.
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ARL OPTIM'X XRF spectrometer
Flexibility, simplicity, reliability, and accuracy are traits of the ARL OPTIM'X: compact, optimized for specific applications, its features are:
* Unique WDXRF platform with sequential and/or simultaneous capabilities
* Fast analysis of solids, liquids and loose powders with superior spectral resolution
* Wider XRF elemental coverage thanks to the instrument's innovative goniometer - the SmartGonio™ - which can now be configured to cover all elements from fluorine (F) to uranium (U) in sequential mode
* No water cooling or gas supply (depending on configuration) required
* Closely coupled optics for increased intensity (50% higher than conventional geometry)
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S2 PICOFOX - The world's most compact TXRF analyzer
S2 PICOFOX TXRF spectrometer
S2 PICOFOX is the world's first and only portable benchtop instrument for fast quantitative and semi-quantitative multi-element microanalysis of liquids, solids, and contaminations using the principle of total reflection X-ray fluorescence spectroscopy.
Reaching detection limits in the ppb and ppm range the S2 PICOFOX is optimally suited for trace element analysis. The advantages are evident in case of small sample amounts, liquid samples with high matrix content and frequently changing sample types.
Due to its complete independence of any cooling medium, the analyzer can be used not only in the laboratory but also for on-site analyses in the field.
For many applications the S2 PICOFOX will be an important enhancement to an existing AAS or ICP-OES system.
Advantages:
- Simultaneous multi-element trace analysis incl. halogenides
- Analysis of smallest sample amounts in the nanogram or microgram range
- Simple quantification using an internal standard
- Suitable for various sample types and applications
- Portable system for fast in-field analyses
- No matrix or memory effects
- Low operating cost
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With the unique X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2 mm down to 10 µm. There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure. Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.
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Liquid nitrogen free energy dispersive X-ray fluorescence spectrometer :
- For RoHS compliance screening
- High resolution liquid nitrogen free Si (Li) semiconductor detector
- For regular X-ray fluorescence analysis of metals, rocks, soil, food, and plating thickness
- Speedy high sensitivity analysis
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The S4 PIONEER - the most compact wavelength dispersive X-ray fluorescence spectrometer (WDXRF) is dedicated to serve all applications with need for high performance and high sample throughput: Whenever reliable trace analysis, high analyzing speed for accurate process control or robustness for industrial use is demanded - the S4 PIONEER is the right choice for industry as well as for research and development.
Accuracy and Precision: The S4 PIONEER with advanced excitation technology provides highest sensitivity esp. for light elements and traces due to optimized beam geometry. Improved analytical performance for light elements is guaranteed with the very thin Beryllium tube window in combination with optimized excitation parameters. Up to 10 primary beam filters, up to 4 collimators, up to 8 crystals, there is no limitation in analytical flexibility; there is no compromise in analytical performance: Real high end wavelength dispersive X-ray fluorescence spectrometry (WDXRF).
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The TE250 Laboratory Ring Pulverizer is the most rugged system of its type. It is used to pulverize a variety of samples to analytical fineness, suitable for analysis by XRF, XRD or optical emission.
A full 1HP motor with direct drive counter weight is used to provide capability for continuous grinding, 24 hours a day, 7 days a week. A simple "scissors" type clamping mechanism is used for reliable, safe operation, grind after grind. Many container types are available in sizes ranging from 10cc sample size up to 250cc sample size.
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Advantages :
This patented design for the automatic mill and press brings new possibilities to the field of automatic pressed pellet sample preparation.
It still has the traditional advantages over manual preparation namely: improved repeatability, higher frequency, better working environment (less dust and noise), less risk of sample cross contamination, better work conditions for the laboratory staff (no need to carry, empty and clean heavy grinding vessels).
Technological innovations : higher grinding efficiency, shorter grinding times, higher fineness (100% < 20 microns), better cleaning of the bowl, complete boric acid sample encapsulation (resistance without the necessity of having a steel ring and a binding agent).
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