|
|
|
|
|
|
Lead Guard
The Lead Guard is comparable to the industry-leading Import Guard except it is calibrated only for lead (Pb), rather than the standard 20+ elements. Many import testing problems are focusing on lead-containing paints, making the Lead Guard a more economical solution. And, customers that purchase the Lead Guard may upgrade to the full element capability (20+ elements) of the Import Guard at any later date, at only a little more cost than the price difference.
Features:
- Analyzes lead in paint in units of mass/area (mg/cm2) for paint layers on base material (substrate)
- Limit of detection < 0.01 mg/ cm2
- Software converts from mg/cm2 to ppm if operator provides data on paint thickness and density
- Add on bulk sample analysis for direct ppm analysis of bulk samples
- X-ray tube-based system eliminates costly resourcing, and regulatory baggage of isotope control
- No isotope licensing or travel restrictions
- Ergonomic, lightweight design
Proven X-ray Tube Technology!
The algorithm and software behind the Lead Guard yields the only tube-based XRF to receive an EPA Performance Characteristic Sheet. This means this XRF is the only non-isotope lead paint analyzer to meet EPA and HUD requirements for the testing of lead in paint in residential settings.
|
|
|
|
|
|
Oxford Instruments has launched the new robust X-ray Fluorescence (XRF) analyzer The New X-MET5000, for highly accurate and reliable elemental analysis.
Engineered for high performance and reliability, this brand new analyzer combines Oxford Instruments’ patented PentaFET® detector technology offering guaranteed fast analysis and lower detection limits for all elements of interest.
Purpose-built for the most demanding quality control applications: scrap metal recycling, analysis of metals for PMI, screening for lead in toys and consumer products for RoHS compliance testing. The X-MET5000 also serves the needs of the mining community for ore exploration, as well as the measurement of heavy metals in soils for environmental monitoring.
The X-MET5000’s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of heavy elements, even when the sample contains light elements like Aluminum and Silicon. This has not previously been possible when using only fundamental parameter calibrations.
This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection. The X-MET5000 is perfect for the harshest environments. The battery’s operating time of one working day enables extended productivity.
The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions. The X-MET5000 will identify material type and automatically choose the best analysis method.
An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.
|
|
Volatile base metal prices, combined with globalized trade in scrap metal, alloy stock, and finished products have increased the costs of alloy mix-ups to suppliers, distributors, and industrial consumers. Now available with groundbreaking GOLDD technology, the Thermo Scientific Niton XL3t Series x-ray fluorescence (XRF) alloy analyzers, meets your demand for faster, more accurate results.
When it comes to metal analysis/alloy analysis, you can choose from a range of configurations of our Niton® XRF alloy analyzers as well as an assortment of optional features and accessories to match any of your analytical needs:
-Scrap metal recycling/scrap metal sorting
-Quality assurance/quality control
-Positive material identification
-Flow accelerated corrosion
-Coating thickness measurement
-Other metal analysis applications
|
|
|
|
|
|
S1 TURBO SD
So what makes the S1 TURBOSD such an important innovation in this field? The key is the XFlash® Silicon Drift Detector, which offers count rates and resolution far superior to traditional SiPIN detector technology. This makes for even faster analysis – one second for grade identification, two to three seconds for assay. That’s about five times faster than previous generations.
Not only that, but the improved resolution and count rate means lower detection limits for all elements analyzed. Combine that with an extensive grade library and you have one of the most powerful handheld analyzers currently available on the market.
The benefits at a glance
- The first ever SDD-based handheld analyzer
- Superior count rates and resolution
- Five times faster than previous generations
- Lower detection limits
- Grade library covers low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
- Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only)
|
|
Innov-X Systems' universal hardware platform can be configured for portable, benchtop, on-board, on-line, and OEM applications. Our line of accessories extends the reach of portable XRF analysis.
Alpha series
Tests for up to 25 elements simultaneously. Ideal for RoHS, Alloys, solder and precious metals.
Advantages include:
- Tube-based system eliminates costly resourcing and loss of speed.
- Multi-element Analysis - in one measurement.
- Definitive Pos./Neg. Classifications.
- No isotope licensing or travel restrictions.
- Ergonomic, lightweight design.
- Versatile PDA platform.
- Easily measures uneven surfaces.
|
|
|
|
|
|
Specifications:
Model: EDX-Pocket Series Handheld X-ray Fluorescence Spectrometer
Detector: 13mm2 electric-cooling Si-PIN detector
Excitation source: 40KV/50uA-Ag anode end window integrated mini X-ray tube
Measurement time: 10-200s (handheld or sitting)
Forms of objects: solid, liquid or powder
Measurable elements: S-U
Ability of simultaneous analysis: up to 24 elements
Detection limit: 0.001%～0.01%
Correction mode: Ag plate
Safety: administrator mode with in-built password at which data can be saved at any time
Data storage: stored in computer for printing out. Massive storage card is supplied
Batter rundown time: 4 hours
Weight: 1.47 Kg(with PDA and battery); 1.2 Kg (without PDA and battery)
Ambient temperature: －10℃－＋50℃
Ambient humidity: up to and including 90%
Configuration:
PDA Si-PIN semiconductor detector
Amplifier circuit
X-ray tube and high and low power supplies
Professional minerals analyzing software in PDA version
Support to Handheld Spectrometer(optional)
Backup battery and adapter (AC and DC)
Sample cup and manual press
Protective case
|
|
|
|
|
|
X-MET5100 – Light Years Ahead!
Oxford Instruments launches a revolutionary hand-held XRF analyzer with Silicon Drift Detector
The new X-MET5100 X-ray fluorescence (XRF) analyzer takes hand-held analytical performance to a completely new level.
X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers fast, highly accurate measurement and enables light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments - a truly huge step forward for hand-held X-ray fluorescence analysis.
PMI inspectors, scrap sorters and in particular the aerospace industry finally have the robust, XRF Light Element mobile testing tool they have been waiting for. The X-MET5100 assures laboratory quality analysis of Aluminum and Titanium alloys, as well as Copper, Nickel and Steel with Light Element capability and sensitivity that is unequalled.
The powerful combination of the SDD, 45 kV X-ray tube and traceable Empirical Calibration means that X-MET5100 can accurately analyze and identify metal alloys in just 1 second. Restricted elements, lead in toys, contaminants in soil and small concentrations in ores can be accurately measured at speeds previously not possible. Trace element results, down to ppm level, can be achieved in just seconds. The unparalleled speed and accuracy of the X-MET5100 ensure high throughput for real-time results that can be trusted.
X-MET5100 is IP54 (NEMA 3) approved for dust and water splash protection and are built to withstand the harshest analytical conditions.
|
|
Innov-X Systems' universal hardware platform can be configured for portable, benchtop, on-board, on-line, and OEM applications. Our line of accessories extends the reach of portable XRF analysis.
Alpha series
Tests for up to 25 elements simultaneously. Ideal for RoHS, Alloys, solder and precious metals.
Advantages include:
- Tube-based system eliminates costly resourcing and loss of speed.
- Multi-element Analysis - in one measurement.
- Definitive Pos./Neg. Classifications.
- No isotope licensing or travel restrictions.
- Ergonomic, lightweight design.
- Versatile PDA platform.
- Easily measures uneven surfaces.
|
|
|
|
|
|
On-line XRF Conveyor Analyzer Con-X
APPLICATION
On-line XRF conveyor analyzer Con-X is used to identify and measure the concentration of the elements and minerals in ores and materials on a conveyor belt.
The analyzer detects elements from Al (Z=13) to U (Z=92)
FEATURES
- On-line non-destructive analysis of material composition directly above a conveyor belt,
- High precision and stability of the results in a severe environment: dust, low/high temperature and humidity,
- Atomic constant library and software for concentration calculation by the combination of the methods of fundamental parameters and empirical coefficients,
- Independence of the measurement results from lump size, relative humidity and distance in the allowable range (6-25 cm),
- Few modifications for light and heavy element analysis,
- Simple and convenient operation and service,
- Empty belt exclusion algorithm.
FAST PAY-BACK
- Economy of raw material,
- Recycling of used material,
- Time economy due to the express analysis.
For additional information, please contact us: XRF@bruker-baltic.lv
|
|
|
|
|
|
There are many reasons why the Tracer family has become the preferred instrument for leading conservation scientists around the world. It combines the power and flexibility you would expect from a bench-top instrument with the convenience of a handheld – thanks to some pioneering, user-oriented innovations. These include the same vacuum technology that we originally developed in partnership with NASA for the space shuttle program. The instrument also comes with powerful laptop-based analytical software, live-time spectral display, and customizable filters and secondary targets, designed to optimize your analysis no matter what the application.
The benefits at a glance
- The capabilities of a bench-top instrument, with the convenience of a handheld
- Powerful laptop-based analytical software
- Customizable filters and secondary targets to optimize analysis
- Live-time spectral display
- Vacuum technology developed in partnership with NASA for the space shuttle program
- Standard package includes 360o tripod
- Proprietary X-FLASH® SDD technology (Tracer III-SD and IV-SD only)
- Unmatched training and support
|
|
Advantages include:
Tube-based system eliminates costly resourcing and loss of speed.
Multi-element Analysis - in one measurement.
Definitive Pos./Neg. Classifications.
No isotope licensing or travel restrictions.
Ergonomic, lightweight design.
Versatile PDA platform.
Easily measures uneven surfaces.
|
|
|
|
|
|
Technology you can trust – at a price you can afford
In the business-critical area of handheld XRF technology, Bruker aims not only to be the best, but also to deliver the best value. Our S1 SORTER is the ideal solution for businesses looking to compete in tough economic times. It delivers performance equal to any system using a SiPIN detector, but at around 30% less than equivalents on the market.
A tough performer
The S1 SORTER hides state-of-the-art technology beneath a very tough shell. The standard calibration covers steel, nickel, cobalt and copper alloys while the optional FP calibration will analyze most exotic alloys and precious metal samples. The S1 SORTER is designed to be used out in the field, in temperatures ranging from -10C to +50C. The splash-proof case is made of industrial-strength plastic, and the holster means you can keep your hands free while working anywhere in the warehouse or yard.
Clarity and usability
We believe the best technology should be intuitive and instinctive to use. Every element of the S1 SORTER has been designed with this in mind. The bright display makes it easy to read in any lighting conditions. The touch screen means you can operate the whole machine with one finger, whether inputting a password or pulling the trigger. The operating system is Microsoft Windows – so well known that it’s almost universal. Data transfer options include Microsoft ActivSync via USB cable or wireless Bluetooth connection, as well as using an SD card. Built-in memory also makes it possible to store thousands of spectra and millions of results safely.
|
|
|
|
|
|
Government regulations, increased public awareness, and legal action have driven the need for lead paint testing. From the world's pioneer in handheld XRF instruments, Thermo Scientific Niton analyzers are still leading the way with unparalleled performance for residential lead paint inspection...fast, easy to use, reliable. Beyond lead paint testing, Niton® analyzers can measure dust wipes, soil samples, and air filters, helping lead professionals meet and exceed public health initiatives. What's more, they address the safe work practices required in many commercial/industrial structures as well as demonstrated proficiency in the ELPAT Program. For measuring lead paint levels, handheld Thermo Scientific Niton XRF analyzers are simply superior.
-Every Niton XRF analyzer contains an environmentally sealed housing for real world use – dust, dirt, and moisture don't impact reliability
-Every Niton XRF analyzer is capable of providing the fastest paint testing results at the highest statistical confidence in the industry.
-Every Niton XRF analyzer offers factory-trained service worldwide in more than 75 countries
-Every Niton XRF analyzer supplies at least 8 hours of battery life, with a free spare — we know your day doesn't always end after 8 hours; your Niton XRF analyzer won't quit either
-Every Niton XRF analyzer offers complete data encryption: your data is never vulnerable to accidental or malicious tampering
-Every Niton XRF analyzer provides fast, secure data downloads, with the spectral fingerprinting that today's juries have come to expect legally defensible data
|
|
|
|
|
|
With increasing frequency, users are looking to photographically document their sample along with the analytical results, especially when looking to comply with the CPSIA or RoHS guidelines. Handheld Niton® XL3t XRF analyzers feature an optional, integrated CCD camera that helps you accurately position the instrument on a specific location of a sample. Images and analysis data are stored together for easy reference, data management, and data integrity.
When you need to isolate and analyze samples, or areas of a sample smaller than the standard 8 mm diameter x-ray spot size, the Niton XL3t offers you an optional small-spot capability. With a couple of taps on the integrated, color touch-screen display, you can select a 3 mm diameter spot size, complete with a bull's-eye superimposed on the image.
-Always immediately available
-Never lost
Together, this first ever integrated CCD camera and small-spot sample area imaging system mean benefits to you:
-Simple isolation and analysis of small parts or areas
-Ideal for positioning, analyzing, and documenting results
-Image and analysis data stored together for easy reference, data management, and data integrity
|
|
|
SPECTRO xSORT handheld XRF spectrometer is a light (1.7 Kg, 3.7 lbs.) and super-fast metal analyzer measures all of the elements, non-destructively, in a metal alloy The SPECTRO xSORT has been designed for the metal processing, recycling, precious metals recycling as well as the petro-chemical industries, where regular control of pipelines and plant infrastructure is a must.
|
|
|
|
|
|
The Thermo Scientific Niton XL3 handheld x-ray fluorescence (XRF) analyzer combines purpose-built, proprietary electronics with an ergonomic design and easy to use software, transforming XRF analysis. It is the only handheld XRF analyzer platform to offer you a choice of excitation sources – either a 50 kV miniaturized x-ray tube in the Niton XL3t for the ultimate performance and flexibility, or the patented Infiniton™ in the Niton XL3p which never requires source replacement. From the integrated tilting color touch-screen display to the customizable menus for ease of use, both lightweight Niton XL3 XRF analyzers provide you with heavyweight performance and a set of features engineered to improve your productivity and profitability.
With over 20,000 handheld XRF analyzers installed since 1994, and an active customer base of over 18,000 instruments, learn why most customers in the recycling and mining segments are achieving a return on investment measured in several months, while many report that they've paid for the cost of the instrument in weeks, and some in as little as one day. Similarly, if you're in the petrochemical industry, you can reduce risk through alloy verification, while if you manufacture toys and other child-accessible products you can use them to drive toy screening compliance with global regulations.
|
|
|
|
|
|
Volatile base metal prices, combined with globalized trade in scrap metal, alloy stock, and finished products have increased the costs of alloy mix-ups to suppliers, distributors, and industrial consumers. Now available with groundbreaking GOLDD technology, the Thermo Scientific Niton XL3t Series x-ray fluorescence (XRF) alloy analyzers, meets your demand for faster, more accurate results.
When it comes to metal analysis/alloy analysis, you can choose from a range of configurations of our Niton® XRF alloy analyzers as well as an assortment of optional features and accessories to match any of your analytical needs.
Scrap metal recycling/scrap metal sorting
Quality assurance/quality control
Positive material identification
Flow accelerated corrosion
Coating thickness measurement
Other metal analysis applications
Now, in addition to our Niton XL3t 800 alloy analyzer, already known for its superior positive grade identification and alloy analysis, we offer the Niton XL3t 900 GOLDD. It is the definitive tool for your analysis requirements, delivering improvements with:
Light element detection (Mg, Al, Si, P, S) without helium or vacuum purge
Overall sensitivity
Shorter measurement times
|
|
|
|
|
|
Handheld Thermo Scientific XRF analyzers represent the state-of-the-art in elemental analysis for mining and exploration applications. The ideal tool for the most demanding jobs is the handheld Thermo Scientific XL3t 500 Series XRF analyzer, now available with groundbreaking GOLDD technology. With a standard analytical range from S through U, and optional lower detection limits achievable with the new Niton XL3t 500 GOLDD - plus light element analysis (Mg, Al, Si, P, S) without helium or vacuum purging - you can identify element concentrations at unprecedented low levels. This means you get results even at or below the averages naturally found in the earth's crust, detecting even the most subtle geochemical anomalies.
With remarkable speed and performance, as well as our trademark point-and-shoot simplicity, our Niton XL3t Series analyzers offer improved value to you through better precision and lower detection limits compared to previously available handheld XRF instruments. They are the ideal tools for measuring elemental concentrations in:
Ores
Soils
Sediments, cuttings and cores
Mill heads and tails
Concentrates
Filter media
|
|
|
|
|
|
Verification and screening for toxic metal in consumer goods are imperative to protect our children from lead poisoning and to reduce the risk associated with distributing lead-containing products.
When it comes to screening toys for lead, or screening other child-accessible products, Thermo Scientific Niton XL3t analyzers, now available with groundbreaking GOLDD technology, are the only handheld x-ray fluorescence (XRF) analyzers that can distinguish between lead on the surface of an object from lead in the substrate. Quick. Accurate. Precise. Niton® XL3t 700 Series XRF analyzers can provide the solution when you need to screen consumer goods for toxic metals…all eight regulated elements in toys designed for children under the age of 12.
Lead (Pb)
Barium (Ba)
Antimony (Sb)
Selenium (Se)
Cadmium (Cd)
Mercury (Hg)
Arsenic (As)
Chromium (Cr)
The Niton analyzer is the same instrument that was chosen and is trusted by the Consumer Product Safety Commission (CPSC) and numerous leading manufacturers and retailers in the consumer goods industry. You benefit in a variety of ways from these remarkable tools:
Multi-use – Toy screening as well as screening fashion jewelry, furniture, and apparel for lead, in compliance with the CPSIA
Handheld – The lead toy test can occur in-situ on the toy, in the factory, product integrity lab, on the dock, or in the warehouse
Fast – Screening takes seconds to minutes, not days. Decision to ship product can happen immediately
Non-invasive – The analyzed product is not defaced or affected in any way
TestAll™ Technology – Automatically selects the correct analytical mode for consumer goods analysis
|
|
|
|
|
|
As environmental consciousness grows and tools for performing environmental analysis become more popular, requirements for identification and remediation of environmental contamination in residential, commercial, and industrial settings are increasing globally.
-Site characterization and conceptual site modeling
-Risk assessment
-On-site clearance screening
-Soil stabilization
-Remediation quality control
How can you improve project turnaround times while holding sampling and analysis costs under control? Handheld Thermo Scientific Niton XL3t 600 Series x-ray fluorescence (XRF) analyzers, now available with GOLDD technology, are the ideal tools for these demanding jobs.
With a standard analytical range from S through U, and optional lower detection limits achievable with the Niton® XL3t 600 GOLDD - light element analysis (Mg, Al, Si, P, S) without helium or vacuum purging - you can identify elemental concentrations from the most subtle anomalies at unprecedented low levels to high levels of contaminated soil, on-site, in real time. You benefit in a variety of ways from these remarkable instruments:
-Immediate sample results on-site - soil analyses, lead dust wipes, air filter analysis
-Real-time delineation of contamination boundaries
-Legally defensible data
-Overall improvement in jobsite productivity
|
|
The Thermo Scientific Niton XL2 x-ray fluorescence (XRF) analyzer is purpose-built for your most demanding needs. When speed, accuracy, and reliability count, our superior combination of hardware, software, and direct industry experience helps meet your specific analytical requirements. With the mid-range Niton XL2, you don't sacrifice performance to get a lighweight, rugged handheld XRF analyzer perfectly matched for most testing applications. It's the value choice for tighter test equipment budgets.
Niton XL2 XRF analyzers provide you with many distinct advantages:
-Very easy to use – even by non-technical personnel
-Rugged design for real-world industrial applications
-Truly nondestructive test
-From turn on to trigger pull to results in seconds
-Confident analysis with technology from the industry leader
Over 20,000 Thermo Scientific Niton XRF analyzers can be found at work in more than 75 countries on 6 continents.
|
|
|
|
|
|
Tracer III-V/III-SDThere are many reasons why the Tracer family has become the preferred instrument for leading conservation scientists around the world. It combines the power and flexibility you would expect from a bench-top instrument with the convenience of a handheld - thanks to some pioneering, user-oriented innovations. These include the same vacuum technology that we originally developed in partnership with NASA for the space shuttle program. The instrument also comes with powerful laptop-based analytical software, live-time spectral display, and customizable filters and secondary targets, designed to optimize your analysis no matter what the application.
These analyzers allow complete user control of the excitation conditions - current, voltage and user selected filter for optimization of measurement conditions for investigation of your objects. The Tracer III-SD incorporates the proprietary X-Flash® Silicon Drift Detector (SDD) which provides high speed data acquisition, better resolution than the traditional SiPIN detector and light element sensitivity. When the Tracer III-SD is operated with the optional vacuum system the ultimate light element sensitivity can be achieved.
In addition to the basic instrument the system is supplied with: 1) powerful lap-top based analytical software which provides live spectral display and complete peak identification; 2) a tripod mount which allows precise three dimensional positioning of the analyzer and 3) unmatched application training and support.
|
|
APPLICATION
Coating Thickness Analyzer is a tool for precise and accurate XRF measurement of various metallic and non-metallic coatings thickness (anticorrosive, insulating, antioxidizing, waterproof, pipe coating, etc.). Base/coating components are elements from Mg to U. System is applicable for control and monitoring of industrial processes.
FEATURES
- Automatic choice of coating thickness evaluation method for optimization of relative error of measurements,
- Remote control of analyzer electronics and software by ETHERNET interface from Workstation Device and communications with OPC server,
very simple and convenient operation and service,
- Possibility to install the measurement block under and above the measured material,
- built-in industrial computer.
For additional information, please contact us: XRF@bruker-baltic.lv
|
|
|
|
|
|
Years of development and attention to customer needs have made Thermo Scientific Niton alloy analyzers the first choice in XRF technology, bringing lab-quality elemental analysis wherever it is needed in a field-hardened package. Now, in addition to superior positive grade identification and composition analysis of alloy/metal coatings and substrates, the Niton® XL3t offers the benefit of our coating thickness/coating weight measurement technology - providing an "out-of-the-box" nondestructive solution for gauging the effectiveness of coating and plating systems.
Fast and easy-to-use, the Niton XL3t 800 not only performs at line and plating bath solution analysis, but provides more accurate measurements than non-XRF technologies such as eddy current, magnetic induction, and Beta backscatter. You get precise, nondestructive multilayer coating thickness results in seconds. Testing at the plating line both increases productivity and improves process efficiency - no more over-coating or under-coating. What's more, the Niton XL3t is your answer to measuring large or irregularly shaped samples, as well as small-diameter wiring or tubing. Cutting samples for benchtop analysis are a thing of the past.
Typical applications are:
-Galvanized zinc over steel
-Zinc or zinc alloy over steel
-Hard chrome over steel
-Electroless nickel over steel
-Chrome/nickel/copper over steel, Zamak™ or plastic
-DACROMET™ coating over steel
|
|
|
SPECTRO MIDEX is a Benchtop XRF system that provides quick, non-destructive determination of the elemental composition for Jewelry and Dental alloys. The analyzer is also well suited for forensic science applications. It uses state-of-the-art XRF technology and proprietary beam collimation techniques to ensure the easiest, most accurate measurement results possible within a typical 2-3-minute response time.
|
|
|
|
|
|
XAN spectrometers for Gold, jewelry and precious metals analysis
The new FISCHERSCOPE X-RAY spectrometers from the proven XAN series are best suited for the gold- and jewelry industry as well as for pawn shops and precious metals recycling. They are optimized for fast, non-destructive analysis of jewelry, precious metals in general, yellow and white gold, platinum and silver, rhodium, coins and all jewelry alloys and coatings.
Measured results are displayed in karat, per mill or weight-%, and easily printed out as customized reports.
They are accurate, safe and easy to use, robust and maintenance free. In addition, they meet the requirements of DIN ISO 3497 and ASTM B 568.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of these instruments. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN spectrometers. Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room.
|
|
|
|
|
|
FISCHERSCOPE X-RAY XDLM and XDAL series
The XDLM spectrometers with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured. Typical applications are measurements on pc-boards, plug contacts and electronic components. XDLM spectrometers are equipped with four exchangeable apertures and a programmable XY(Z) measuring stage. This makes them ideally suited for testing mass-produced parts.
The XDAL spectrometers with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentration and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
The XDAL and XDLM spectrometers have an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things.
Using the FISCHER fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free.
|
|
FISCHERSCOPE X-RAY XUL series
The models of the XUL series are compact x-ray fluorescence spectrometers for coating thickness measurements and material analyses. They are well suited for the electroplating industries to measure small parts with different shapes, such as screws, bolts or nuts, for contacts and other electronic components. Also the metal content of electroplating baths can be analyzed quickly and easily.
The XULM model with its micro focus x-ray tube is designed for measurements on very small parts, plug contacts and wires. It is particularly well suited for the jewelry and watch industries but also for manual measurements on pc-boards.
The x-ray source and the detector are located underneath the measurement chamber. This allows for simple and precise positioning of the specimens. An integrated high-resolution video camera supports the precise positioning.
|
|
|
|
|
|
The FISCHERSCOPE®-X-RAY XDV®-SDD is a universally applicable energy dispersive x-ray spectrometer. It is particularly well suited for the non-destructive analysis of very thin coatings, for small concentrations trace analysis and for automated measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of ≤0.1 μm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
|
|
|
|
|
|
Oxford Instruments’ launches a powerful, new, easy-to-use EDXRF spectrometer – designed for operation by anyone!
The innovative, high performance X-Supreme8000, is a compact, energy-dispersive
X-ray fluorescence (EDXRF) spectrometer for quality assurance and process control requirements across a diverse range of industries.
Customized applications include:
• Minerals and mining
• Petrochemicals – fuels/lubricating oils
• Wood pressure treatments
• Cement
• Food and cosmetics
• Plastics and polymers
• Education
Meeting the ever increasing requirement for minimal or no sample preparation and unattended operation, the highly flexible X-Supreme8000, with its unique Oxford Instruments’ Silicon Drift Detector (SDD) and powerful X-ray tube technologies, can perform multi-element analysis on a wide range of sample types. These include: solids, liquids, powders, pastes and films at concentrations from high percentage down to ppm levels of detection, covering elements Na11 to U92 in the periodic table.
|
|
|
|
