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Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... In the fast-paced world of battery manufacturing and analysis, speedy throughput is everything. But so is precision particle analysis. The Thermo Scientific Phenom ParticleX Battery Desktop SEM gives ...
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron probe and a backscattered electron probe, it ...
Magnification: 1,000,000 unit
Resolution: 0.9 nm - 2.5 nm
... CIQTEK SEM4000Pro FESEM Microscope Specifications • Electron Optics - Resolution: High Vacuum 0.9 nm @ 30 kV, SE Low Vacuum 2.5 nm @ 30 kV, BSE, 30 Pa/1.5 nm @ 30 kV, SE, 30 Pa Acceleration Voltage: 0.2 kV ~ ...
CIQTEK Co., Ltd.
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
... CIQTEK SEM2100 SEM Microscope Specifications Electron Optics Resolution: 3.9 nm @ 20 kV, SE 4.5 nm @ 20 kV, BSE Accelerating Voltage: 0.5 kV ~ 30 kV Magnification (Polaroid): 1 x ~ 300,000 x Specimen ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9, 1.2, 1.9 nm
... CIQTEK SEM4000X FESEM Microscope Specifications Electron Optics - Resolution: 0.9 nm@ 30 kV, SE 1.2 nm@15 kV, SE 1.9 nm@1 kV, SE 1.5 nm@1 kV (Ultra beam deceleration) ...
CIQTEK Co., Ltd.
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