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Burn-in test socket GD18-TO263-7-x-109
for transistor outline (TO) packageKelvin

Burn-in test socket - GD18-TO263-7-x-109 - JC CHERRY INC. - for transistor outline (TO) package / Kelvin
Burn-in test socket - GD18-TO263-7-x-109 - JC CHERRY INC. - for transistor outline (TO) package / Kelvin
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Characteristics

Applications
for transistor outline (TO) package
Options
burn-in, Kelvin

Description

TO Package Test Socket For TO-263-7/D2-PAK Size18x32.9mm / 0.71x1.30" Clamshell - Burn-in Test - Kelvin Contact(Option) - Current Rating : 12A - Operating Temperature : [Acceptable Device] AUIRFSA8409-7P (Infineon) C3M0075120J (CREE) STH300NH02L-6 (STMicroelectronics) SQM40016EM (Vishay) ** Including terminal temperature rise. Also possible to support other terminal patterns. Please contact us for more details. After conducting a simulation, we will decide which dimension to adopt and make a proposal. ・The PCB Patten is common for Terminal Patterns A, B, and C ・Thru holes GK,DK,SK are for Kelvin contact. If Kelvin Contact is not required, these holes are not necessary. Able to support other device size. Please contact us for more information. Although the device is listed, but it may not be compatible due to the large tolerance of the device dimension. Therfore, please send the sample of the device in advance and we will check the compatibility.

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