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The TRANSIENT 2000 (TRA2000) family of generators, replicate EMC events that can be observed in the low power distribution system, telecommunication or data lines. TRA2000 generators are available in a number of basic versions which can all be upgraded to give full test capability at a later date.
TRANSIENT 2000 generators can replicate the following phenomena:
ElectroStatic Discharges (ESD), Electric Fast Transients (EFT),Combination Wave, Ring Wave and 10/700 Telecom (SURGE), AC and Impulse Magnetic Fields, AC and DC power line interruptions (DIPS).
With some basic accessories this can be expanded to include;
Common Mode tests (DC to 9kHz), Telecommunication tests 10/700us Balanced & un-balanced, Three Phase Testing to 63A for EFT, SURGE, Ring Wave and Three Phase Testing to 100A Dips & Interrupts.
Available with single or multiple events (ESD, EFT, SURGE, RING, DIPS), EMC Partner TRANSIENT generators can all be upgraded to add further capability when required. Unique in their class, TRANSIENT systems include as standard an internal motor variac to enable Dips and Variation tests, at any user programmable level, as per IEC 61000-4-11. |
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Impulse Voltage Test System - For the generation of high voltage lightning and switching impulses according to IEC 60060 for indoor and outdoor use.
Including:
- impulse voltage generator
- charging and control unit
- control and measuring system
- chopping gaps
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The GP1550 series features:
- pulse widths from 10nS to 10S
- delays from 0nS to 10S with up to 6-digits resolution.
- Output levels are from -10V to +10V, with pulse amplitudes from 0.5V to 10Vp-p into a 50 Ohm load.
The GP1612H features:
- variable pulse widths from 10 ns to 10 s,
- delays from 0 ns to 10 s with up to 6 digits resolution
- adjustable output levels from -8V to +8V, with pulse amplitudes from .1V to 16Vp-p into 50 ohms load (.2V to 32Vp-p into open circuit).
These Pulse Generators also feature selectable complementary pulse and double pulse, in continuous, triggered, gated and counted burst modes.
They allow selection of predefined amplitude and offset for critical stimulus and testing of major semiconductor technologies as TTL, CMOS and ECL.
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