Nanotechnology microscopes

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scanning transmission electron microscope
scanning transmission electron microscope
SU9000 II

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

... The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope (STEM) optimised for extreme resolution. This is made possible by the unique electron optics of ...

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Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU7000

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The SU7000 is ideal for large or heavy samples and for integrating a wide range of accessories. These accessories include analytical detectors or stage attachments for in-situ sample manipulation (stretching [tensile] / compression, heating/cooling, probing, ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
SU3800/3900 Family

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated by automatically ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
FlexSEM II

Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm

... FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...

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Hitachi High-Tech Europe GmbH
SEM microscope
SEM microscope
TM4000PlusIII

Magnification: 10 unit - 250,000 unit

... sample stage is done using an automatically generated, zoomable colour photo overview. This can be supplemented locally by SEM photo snapshots. Product features: - EDX with 30mm2 or 60mm2 sensor size can be fully integrated, immediate ...

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Hitachi High-Tech Europe GmbH
STEM microscope
STEM microscope
HF5000

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

The HF5000 is a Cs-corrected S/TEM customisable for in-situ experiments. The special feature is provided by the Everhart Thornley SE detector, which images the surface of the sample at 60-200kV, just like in an SEM. This is particularly advantageous for ...

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Hitachi High-Tech Europe GmbH
optical microscope
optical microscope
Eclipse LV100ND

Weight: 9.5 kg
Length: 657 mm
Width: 251 mm

... Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope design ...

metallographic microscope
metallographic microscope
DS series

... analyzes. Entry-level inverted microscope for general purpose applications for hardness testing. Industrial and materials science inverted microscope especially designed for opaque specimens (including metals microstructure ...

AFM microscope
AFM microscope
DriveAFM

... compromising on scan size or setup type. DriveAFM performs in a stand-alone setup as well as integrated with an inverted optical microscope. A full range of imaging modes, the possibility to use small cantilevers, and accessories and ...

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