Optical polarimeter LSM-9001NIR

automaticdigital

Overview
Evaluate 2D distribution of strain (retardation) on low-phase-difference samples such as semiconductor wafers, colored glass and colored acrylic resin products. Capable of evaluating up to approx. 50×50 mm in about 1 minute.

Model name
Fully Automatic Strain Eye LSM-9001NIR

Inspection method
NIR Rotating Analyzer Method

Key features

• Fully automatic measurement: place the sample and start measurement; results are calculated from images captured by the built-in camera without subjective judgment, reducing operator workload and measurement variability.
• Measures strain, residual stress and cracks on semiconductor wafers and colored or transparent products that are difficult to assess with conventional polariscopes.
• Comprehensive software analysis: 2D distribution maps with cross-section graphs, histograms for arbitrary areas, 3D visualization, CSV export of results and image storage for traceable analysis.
• High-luminance LED light source for long life and reduced power consumption, lowering maintenance and operating costs.

Specification

• Inspection Method: NIR Rotating Analyzer Method
• Measurement Range (approx.): 0–150 nm (retardation)
• Measurement area size (approx.): 50×50 mm
• Measurement time: approx. 1 minute for 50×50 mm
• Measurement object placement space (height): Max 160 mm
• Size: W300 × D353 × H540 mm
• Weight: 22 kg
• Light Source: high-luminance LED
• Power Source: AC100–240V 50/60Hz; DC input 24V 1.6A
• Components: Main body, PC, Cables; Accessory: Main body cover
• OS: Windows 10 Pro (64bit) Japanese/English