Rockwell hardness tester Qness 10 / 60 M

BrinellVickersbenchtop

Overview
The Vickers/Knoop/Brinell/Rockwell micro hardness tester series Qness 10 / 60 combines microhardness testing and microscopy in a laboratory-grade instrument. The Qness 10 / 60 M model offers semi-automatic operation with high-precision Z-axis positioning and an integrated color camera for reproducible, traceable results. QATM testers integrate with the Verder Scientific IoT platform for remote monitoring, alerts and automated backups.

Product advantages

• Semi-automatic operation with controlled automated Z-axis
• Very wide test force range (0.25 g – 62.5 kgf depending on model)
• Ready-to-test package including ASTM+DAkkS certified Vickers indenter and 5x/50x objectives
• Dynamic 8-position tool turret for up to 3 hardness modules and 7 objectives
• Qpix Control2 M software with Qpix INSPECT microscopy modules
• Digital XY cross slide with positional feedback and optional cross slide variants
• CAS collision-avoidance and dual-Z axis concept for speed and high-resolution positioning

Revolutionary optical system
The in-house lens system delivers high-contrast, crystal-clear images for hardness measurement. Koehler illumination with white LED and a motorized aperture diaphragm ensures ideal contrast at high magnifications. The optical concept and lenses comply with DIN EN ISO 6507-1/2:2018 test system definition requirements.

Microscopy and analysis with Qpix INSPECT
Qpix INSPECT provides advanced image analysis and microscopy functions to support materials characterization and quality control:

• Phase analysis with automatic object dimensioning and surface fraction outputs (tables/diagrams)
• Particle size determination via linear or circular section methods (DIN EN ISO 643, ASTM E-112)
• Layer thickness measurement with semi-automated gauging and statistical outputs (DIN EN ISO 1463)
• Weld seam measurement templates and automatic pass/fail evaluation (DIN EN ISO 5817)
• Surface indentation recognition for challenging surfaces such as etched or ground samples

Operation and automation
Designed for efficient sample handling and serial testing, the instrument includes LED test-space lighting, illuminated status display, versatile sample holders (embedded and non-embedded), optional prisms and vices, digital caliper integration, barcode/QR/DMC reader support, NFC login and batch/template workflows via Qpix Control2 M. Connectivity options include Qconnect and Industry 4.0 integrations.

Multimedia and 3D AR
The product page supports a product video and an embedded AR 3D model for visualization in real-world settings to aid layout planning and demonstrations.

Technical specifications

• Test force range: Qness 10 M: 20 gf – 10 kgf (0.196 – 98.07 N); Qness 60 M: 0.25 gf – 62.5 kgf (0.00245 – 612.92 N)
• Test methods: Vickers, Knoop, Brinell, Rockwell (option)
• Test sequence: Fully automated / electronic force application
• Z-axis: Dynamic automated (CAS technology), dual-Z concept
• Z-axis travel: 150 mm standard, option 260 mm
• Throat depth: 170 mm
• Tool positions: 8-position motorized turret; up to 3 hardness modules, up to 7 objectives
• Camera: 5 MP CMOS color, USB 3.0
• Optical system: Upright microscope with Koehler illumination; motorized aperture diaphragm
• Objectives: XLED 2x, 2.5x, 5x, 10x, 20x, 50x, 100x; achromat and semi-apochromat options
• Field of view: 0.074 x 0.055 mm (100x) to 2.80 x 2.10 mm (XLED 2)
• Table size: Ø100 mm; cross slide option 135 x 135 mm; traverse paths X25 x Y25 mm standard
• Control elements: Emergency stop, start button, Z-axis joystick
• Software: Qpix Control2 M included; Qpix INSPECT modules available
• Max workpiece weight: 50 kg; device weight approx. 55 kg
• Included equipment: Vickers indenter ASTM+DAkkS, 5x and 50x objectives
• Interfaces: 1 x USB 3.0; Power: 100–240 V, 45–65 Hz