Inspection machines for the electronics industry

61 companies | 210 industrial products

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11 products Nikon Metrology
Nikon Metrology NEXIV FOUP
semiconductor inspection machine NEXIV FOUP Nikon Metrology

The NEXIV VMR-C4540 - designed for use with 300mm Front Opening Unified Pod (FOUP) & Front Opening Shipping Box (FOSB)...

Nikon Metrology 300 mm | Optistation-7
wafer inspection machine 300 mm | Optistation-7 Nikon Metrology

Built to accept the latest technology in wafer transport, and incorporating its own...

Nikon Metrology 200 mm | Eclipse L200N Series
wafer inspection machine with microscope 200 mm | Eclipse L200N Series Nikon Metrology

Combined with Nikon’s superior CFI60 LU/L optical system and an extraordinary new illumination system,...

Nikon Metrology 300 mm | Optistation-3000
wafer inspection machine 300 mm | Optistation-3000 Nikon Metrology

Its efficient transfer sequence, new robotic arm, FOUP opener, and enhanced macro observation...

Nikon Metrology 300 mm | Optistation-3100
wafer inspection machine 300 mm | Optistation-3100 Nikon Metrology

Engineered to provide cost-effective support for 300mm wafers with a minimal footprint,...

Nikon Metrology 300 mm | Optistation-3200
semiconductor inspection machine 300 mm | Optistation-3200 Nikon Metrology

One of Nikon’s most advanced and versatile semiconductor inspection systems, the Optistation...

GE Inspection Technologies 27 x 25
X-ray inspection machine for circuit boards 27 x 25", 180 kV | phoenix microme|x DXR-HD GE Inspection Technologies

The phoenix microme|x DXR-HD is a high-resolution 180 kV microfocus X-ray inspection system for real time inspection of solder joints and electronic components as well as for automated inspection (µAXI). Innovative...

GE Inspection Technologies 680 x 635 mm, 180 kV | phoenix microme|x
X-ray inspection machine for circuit boards 680 x 635 mm, 180 kV | phoenix microme|x GE Inspection Technologies

The phoenix microme|x is a high-resolution microfocus X-ray inspection system that is mainly designed for real time X-ray inspection of solder joints and electronic...

GE Inspection Technologies 16 x 16
X-ray inspection machine for circuit boards 16 x 16", 160 kV | phoenix x|aminer GE Inspection Technologies

The phoenix x|aminer is an easy to use entry level X-ray inspection system with strong performance that is designed for the special needs of the high-resolution inspection of electronic assemblies, components...

GE Inspection Technologies 28 x 22
printed circuit board assembly inspection machine 28 x 22", max. 100 kV | pcba|inspector GE Inspection Technologies

The phoenix pcba|inspector is a high-resolution 2D microfocus X-ray inspection system designed for inspecting solder joints (e.g....

Hitachi High-Technologies Europe CD-SEM CG5000
CD-SEM (critical dimension-scanning electron microscopy) wafer inspection machine CD-SEM CG5000 Hitachi High-Technologies Europe

New CD-SEM designed for sub-22nm technology node and beyond. CG5000 delivers High-Resolution, High-Throughput and High-Repeatability by utilizing improved electron optics, advanced image processing and...

Hitachi High-Technologies Europe SEM CG4100
CD-SEM (critical dimension-scanning electron microscopy) wafer inspection machine SEM CG4100 Hitachi High-Technologies Europe

CD-SEM for 32nm technology node and beyond. In order to achieve higher level of measurement accuracy for advanced technology nodes, Hitachi has entirely improved the platform. The effect of the new development...

Hitachi High-Technologies Europe RS6000 Series
DR-SEM (defect review-scanning electron microscopy) wafer inspection machine RS6000 Series Hitachi High-Technologies Europe

Inline Review SEM to contribute for next generation by high speed ADR and accurate ADC. Features Superior Quality and Contrast New electron optic system provides enhanced resolution and contrast,...

Hitachi High-Technologies Europe LS Series
unpatterned wafer surface inspection machine LS Series Hitachi High-Technologies Europe

Wafer surface inspection system to detect any type of small defects on non-patterned wafer of next generation device. Features New optics and...

Hitachi High-Technologies Europe IS Series
patterned wafer defect inspection machine IS Series Hitachi High-Technologies Europe

Delivering high detection sensitivity and high inspection throughput which enables yield improvement and production cost reduction. Features Enhance both detection...

Hitachi High-Technologies Europe NE4000
EBAC interconnection defect visualization system for semiconductor devices NE4000 Hitachi High-Technologies Europe

The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC* analysis and imaging of microelectronic device interconnects, materials, and components. EBAC...

Keithley Instruments 2520
laser diode test system 2520 Keithley Instruments

The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing...

Keithley Instruments ACS
semiconductor characterization software ACS Keithley Instruments

Keithleys Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for semiconductor...

Keithley Instruments System 25
programmable laser diode test system System 25 Keithley Instruments

Keithley’s LIV (light-current-voltage) Test System Kit is designed to help manufacturers of laser diode modules (LDMs) keep pace with production demands...

SEIKO Precision Inc. VWS-200
workstation for electronic device visual inspection VWS-200 SEIKO Precision Inc.

The vision work station provided with a CCD camera for imaging recognition realizes a flexible low-cost system to be used in the inspection processes for cellular, PDA and various products. ◇ Applications ■...

VISION ENGINEERING LTD Lynx VS8
inspection stereo microscope for PCBs Lynx VS8 VISION ENGINEERING LTD

Lynx VS8 is an advanced eyepiece-less stereo microscope for specialist Printed Circuit Board (PCB) inspection and is ideal for all electronics applications including fine pitch, surface mount, TAB and...

BE Semiconductor Industries DS9000e
wafer inspection and sorting machine DS9000e BE Semiconductor Industries

The Datacon DS9000e is a high speed fully automatic die sorter with output to a frame or carrier. It handles any wafer sizes up to 300 mm and can...

23 products KLA - TENCOR
KLA - TENCOR 29xx, 28xx  Series
patterned wafer defect inspection machine 29xx, 28xx Series KLA - TENCOR

The 2900 Series broadband defect inspection platform provides significant advancements in optical defect inspection, enabling capture of previously undetectable wafer defects on challenging...

KLA - TENCOR Puma 9650
patterned wafer defect inspection machine Puma 9650 KLA - TENCOR

The Puma 9650 narrowband optical defect inspection system incorporates technological advances in sensitivity and noise control, providing improved defect capture in yield-critical die areas, such...

KLA - TENCOR eS80x Series
electron beam patterned wafer defect inspection machine eS80x Series KLA - TENCOR

The eS805 electron beam inspection system captures leading-edge physical and electrical defects on a wide range of layers and structures,...

KLA - TENCOR 8900
high-sampling patterned wafer defect inspection machine 8900 KLA - TENCOR

Suitable for detecting a wide variety of defects in the sub-micron to five-micron range, the 8900 is the fastest of all KLA-Tencor patterned-wafer defect inspection systems. Based on the production-proven...

KLA - TENCOR CIRCL™
patterned wafer macro defect inspection machine CIRCL™ KLA - TENCOR

CIRCL™ is a cluster tool with four modules, covering all wafer surfaces and providing parallel data collection at high throughput for efficient process control. The modules comprising CIRCL include:...

KLA - TENCOR VisEdge CV300R, CV300R-EP
wafer edge defect inspection machine VisEdge CV300R, CV300R-EP KLA - TENCOR

The VisEdge CV300R and CV300R-EP wafer edge inspection and metrology systems utilize innovative technology to meet edge-defect inspection and edge metrology requirements for development and volume production...

EADS North America Defense Test and Services, Inc. 8 - 32 bit, 4 - 8 MB/s | 7064R
prototyping module 8 - 32 bit, 4 - 8 MB/s | 7064R EADS North America Defense Test and Services, Inc.

The 7064R Series of C-sized, register-based prototyping modules simplify the engineers task of developing custom VXIbus products. The built-in VXIbus interface and complete documentation package, including...

4 products Ersa GmbH
Ersa GmbH MOBILE SCOPE
BGA video inspection system MOBILE SCOPE Ersa GmbH

The ERSA mobile scope is a compact and handy, portable video microscope to inspect solder joints in electronic production environments. The device has been designed for optical inspection and digital...

video Ersa GmbH ERSASCOPE 2
BGA video inspection system ERSASCOPE 2 Ersa GmbH

The ERSASCOPE 2 now uses megapixel, digital USB 2.0 camera technology offering up to 400 % more resolution! Enhanced images allow for increased clarity...

Ersa GmbH ERSASCOPE 1
BGA video inspection system ERSASCOPE 1 Ersa GmbH

The ERSASCOPE 1 is a re-designed system offering the award winning, original ERSASCOPE inspection capability at the lowest price possible. ERSASCOPE 1 - Value Added Features:...

Ersa GmbH ERSASCOPE XL
BGA video inspection system ERSASCOPE XL Ersa GmbH

The ERSASCOPE System XL allows for the use of either ERSASCOPE 1 or ERSASCOPE 2 optics for big...

3 products MICRO-EPSILON
MICRO-EPSILON
LED quality tester MICRO-EPSILON

ColorCONTROL MFA is used for quality...

MICRO-EPSILON 2 - 5 mm
wafer inspection machine 2 - 5 mm MICRO-EPSILON

The wafer edge inspection system measures the surface of the wafer with high precision using three image processing cameras. Defects larger than...

MICRO-EPSILON 2500 mm | dimensionCONTROL 8260
measuring device for the semiconductor industry 2500 mm | dimensionCONTROL 8260 MICRO-EPSILON

The “dimensionCONTROL 8260 for Ingot” measuring system inspects the surface of the bricks using several laser line scanners and in doing so measures the side lengths, phase lengths,...

video MTI Instruments ø 150 - 300 mm | Proforma 300SA
semi-automatic wafer inspection machine ø 150 - 300 mm | Proforma 300SA MTI Instruments

The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly...

video MTI Instruments ø 75 - 200 mm | Proforma 200SA
semi-automatic wafer inspection machine ø 75 - 200 mm | Proforma 200SA MTI Instruments

The Proforma 200SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Built around MTI Instruments’ exclusive Push-Pull capacitance technology,...

1 products CAMECA
CAMECA IMS 7fR
measuring device for the semiconductor industry IMS 7fR CAMECA

High Performance SIMS Instrument for the Analysis of Radioactive Samples The IMS 7fR is a shielded magnetic sector SIMS instrument specifically developed for the analysis of highly radioactive materials....

DEK Printing Machines Ltd HawkEye™
printed circuit board assembly inspection machine HawkEye™ DEK Printing Machines Ltd

HawkEye™ is a print verification solution aimed at operators, not just process engineers. Its fast to set-up and easy to understand, delivering high speed paste-on-pad verification to highlight...

SCHMID Group | montratec AG
wafer inspection and sorting machine SCHMID Group | montratec AG

The Metrology Sorter System is the user-friendly on-the-fly final inspection and sorting in SCHMID’s Wafer Backend* and is designed for diamond wire cut and slurry cut wafers as well as for monocrystalline,...

4 products Spire Solar
video Spire Solar Spi-Cell Sorter™
automated solar cell test machine Spi-Cell Sorter™ Spire Solar

High-Throughput Automated Solar Cell Tester The Spi-Cell Sorter™ sorts photovoltaic cells according to their electrical performance, tested under simulated sunlight. A pulsed xenon lamp with an optical...

Spire Solar
manual inspection station for solar cells Spire Solar

The Inspection Station includes a ball table with pop-up pads to secure the module. A power supply with clip leads is used to measure...

Spire Solar Spi-EL™  series
electroluminescence inspection system for solar module Spi-EL™ series Spire Solar

High Resolution Inspection for Solar Modules The Spi-EL series of solar module testers uses electroluminescence (EL) measurements to identify microcracks and other invisible defects in modules. The testers...

Spire Solar Spi-Module QA™ 3500 & 4600
automated solar cell test machine Spi-Module QA™ 3500 & 4600 Spire Solar

Automates Spi-Sun Simulator, Hi-Pot & Labeling The Spi-Module QA is an automated photovoltaic module testing system that combines the advanced I-V measurement capabilities of the Spi-Sun Simulator with...

Rudolph Technologies Explorer Cluster
modular wafer inspection machine Explorer Cluster Rudolph Technologies

The Explorer Architecture allows individual systems to be configured with any combination of wafer front, back, and edge...

Rudolph Technologies F30™
wafer inspection machine F30™ Rudolph Technologies

Designed to blur the lines between DF micro inspection and traditional macro inspection, the F30 module boasts a five...

Rudolph Technologies NSX 320
inspection machine for the electronics industry NSX 320 Rudolph Technologies

The NSX® family is the market leader for automated macro defect inspection for advanced packaging. Built on that success, the NSX 320 system offers...

Rudolph Technologies NSX Metrology Series
wafer inspection machine NSX Metrology Series Rudolph Technologies

Unique and established 3D technologies now combined with macro defect inspection to offer a complete 2D/3D inspection and metrology solution for emerging advanced packaging applications. As advanced...

Rudolph Technologies E30™, B30™
wafer inspection machine E30™, B30™ Rudolph Technologies

The Class 1 certified E30 and B30 modules (available separately or combined in one module)...

Rudolph Technologies NSX® 220
wafer inspection machine NSX® 220 Rudolph Technologies

The NSX® 220 System is a streamlined version of the NSX 320 System, designed to provide automatic defect inspection at a low price point for traditional back-end manufacturing who do not need the...

Axsys Technologies LaserTrac™
in-line wafer inspection unit LaserTrac™ Axsys Technologies

General Dynamics has deep domain experience in developing precision micro inspection imaging systems used in some of the most demanding applications such as processing semiconductor wafers, read-write...

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