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For Crystal Devices test socket GUT8 Seriesburn-in
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Characteristics
- Applications
- For Crystal Devices
- Options
- burn-in
Description
Test Socket For Crystal Device (Quartz Oscillators, MEMS, etc.)
Open Top Type
This test socket is designed for automated device setup and is ideal for performance evaluation of components such as crystal oscillators.
- Compatible with various package sizes: 2016, 2520, 3225, 5032, and more
- Optimized for cost and lead time
- Custom designs available upon request with device specifications
Specifications(Typical)
Current Rating : 0.5A at 25°C
Initial Contact Resistance : 200mΩ max
Dielectric Strength Voltage : AC100V rms 1 min
Insulation Resistance : 1000MΩ min at DC100V
Temperature Range : -40 to +150°C
Catalogs
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TestSockets for Characterization Test
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.