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For Crystal Devices test socket GU10 Seriesburn-inhigh-frequencymanual
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Characteristics
- Applications
- For Crystal Devices
- Options
- burn-in
- Other characteristics
- high-frequency, manual
Description
Test & Burn-In Socket For Quartz Oscillators, MEMS, etc.
Clam-shell, High Frequency type
Frame size 10x16mm / 0.39x0.63"
Designed for manual device setting.
Suitable for characteristic evaluation tests.
Uses ultra-short probe pins with a floating structure,
suitable for use with high frequencies.
- Temperature -40 to +150°C(typ.)
- High reliability
- Cost competitive
- Customizable to suit your device
Target device types:
Quartz Crystal Unit, Quartz Oscillators, MEMS Devices,
SAW Filters, Tuning Fork Resonators, etc.
Catalogs
GU10 Series
3 Pages
Other JC CHERRY INC. products
TestSockets for Characterization Test
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.