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Dip solder test socket GU10 SeriesFor Crystal Devicesburn-inmanual
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Characteristics
- Applications
- For Crystal Devices
- Options
- burn-in, dip solder
- Other characteristics
- manual
Description
Test & Burn-In Socket For Quartz Oscillators, MEMS, etc.
Clam-shell, Solder Dip type
Frame size 10x16mm / 0.39x0.63"
Designed for manual device setting.
Suitable for characteristic evaluation tests.
Standard lineup of sockets accommodating various sizes such as 3225, 5050, and 7050.
- Temperature -40 to +150°C(typ.)
- High reliability
- Cost competitive
- Customizable to suit your device
Target device types:
Quartz Crystal Unit, Quartz Oscillators, MEMS Devices,
SAW Filters, Tuning Fork Resonators, etc.
Catalogs
GU10 Series
3 Pages
Other JC CHERRY INC. products
TestSockets for Characterization Test
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.