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Magnification: 2,000,000 unit
Resolution: 2, 10, 3 nm
Tabletop field emission gun scanning electron microscope for high quality imaging across disciplines. Field emission gun scanning electron microscope The Thermo Scientific ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 1.4, 0.7, 1.2 nm
Weight: 5 kg
... high-resolution, advanced 3D characterization and analysis at the nanometer scale. Backscattered electron and secondary electron imaging The innovative NICol electron ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 7, 3 nm
Weight: 5 kg
Scanning electron microscope for industrial research and development with environmental scanning electron microscope capability. Environmental scanning electron ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
Phenom XL G2 Desktop SEM applications The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm
Desktop SEM for robust and effortless SEM analysis, expanding your research capability. Phenom Pro Desktop SEM The sixth-generation of Thermo Scientific Phenom Pro G6 Desktop SEM ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm
Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis. Phenom Desktop SEM with energy-dispersive X-ray diffraction The sixth-generation ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm
Desktop SEM that is economical and easy to use, with reliable automation features. The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Desktop scanning electron microscope for battery production and research. Advanced battery materials analysis Phenom Desktop SEM designed for battery materials analysis In battery ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
... ISO 4406/4407 are available. Secondary electron detector A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 10 nm
Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm. Additive manufacturing analysis The Thermo Scientific Phenom ParticleX Desktop Scanning Electron ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
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