Benchtop probe station DX series
magnetic

benchtop probe station
benchtop probe station
benchtop probe station
benchtop probe station
benchtop probe station
benchtop probe station
benchtop probe station
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Characteristics

Type
magnetic, benchtop

Description

The magnetic field probe station is mainly used for testing the electrical and magnetic characteristics of semiconductor materials, micro-nano devices, magnetic materials, spintronic devices and related technical fields. It can provide a magnetic field or variable temperature environment, and perform high-precision DC/RF measurements. The company's products design and produce various magnetic field probe stations with strong stability, diverse functions, and upgradeable expansion. They are suitable for experimental research and production in universities, research institutes, and the semiconductor industry.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.