- Detection - Measurement
- Electrical Measurements
- Semi-automatic probe station
- Xiamen Dexing Magnet Tech. Co., Ltd.
Semi-automatic probe station DX1PS2magnetic
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Characteristics
- Type
- semi-automatic, magnetic
Description
Overview
Key features
Technical specifications
Equipment upgrade options
- One-dimensional vertical magnetic field probe station DX1PS2 providing a controlled vertical magnetic field environment for probe testing with high uniformity and precise real-time field monitoring.
- Engineered to support simultaneous multi-probe measurements and to permit microscope observation during needle probing via a movable/removable upper magnetic yoke.
Key features
- Provides a vertical magnetic field with high uniformity across the test region (±1% @ d2mm).
- Real-time magnetic field monitoring and closed-loop feedback with monitoring accuracy better than 1% and field resolution better than 0.02 mT.
- Movable/removable upper magnetic yoke for microscope access during probe contact.
- Designed for simultaneous multi-probe testing: up to 4 DC probe sets and up to 4 microwave probe sets.
Technical specifications
- Model: DX1PS2
- Magnetic field direction: Vertical
- Maximum magnetic field strength: >1.2 T
- Air gap: 7 mm (upper yoke removable)
- Sample size: 20 mm × 20 mm (upgrade option available for 4-inch wafer testing)
- Probe type and quantity: DC probes (4 sets) / microwave probes (4 sets)
- Sample stage parameters: XY axis movement stroke ±15 mm; horizontal displacement adjustment accuracy 1 µm; T axis 5° fine adjustment
- Microscope type: monocular microscope
Equipment upgrade options
- Semi-automatic multi-axis sample stage
- Fast probe-plane lifting function
- Upgradeable to a 4-inch wafer magnetic field probe station
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Probe Station
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