Optical detector MIV-X

ultrasonicthermalfor cameras

Overview
Ultrasonic optical flaw detection enables visualization of near-surface internal defects (approximately 1 mm depth) that are difficult to detect with conventional ultrasonic testing. The MIV-X combines an ultrasonic oscillator with stroboscopic illumination and a camera using Shimadzu's proprietary light imaging technique to optically detect surface displacement and visualize ultrasonic wave propagation. Suitable for inspection of cracks, voids, delamination, adhesive peeling, paint, thermal spray coatings and joints in multi-material structures.

Quick visual inspection

• Attach the ultrasonic oscillator to the sample and position the camera above the inspection area.
• Ultrasound propagation is displayed as video, enabling rapid visual identification of flaws.
• Intuitive software allows marking of defects and direct measurement of sizes on images/videos.
• Optional Optical Zoom Set reduces minimum detectable defect size for smaller flaw detection.

How it works
The system optically detects minute surface displacements caused by ultrasonic waves. By synchronizing an ultrasonic oscillator with stroboscopic illumination, surface wave propagation becomes visible as captured images or videos. Operators can mark defects and measure distances between points to determine defect location and size.

Key features

• Shimadzu proprietary light imaging: optical detection of ultrasound-induced surface displacement.
• Effective for near-surface defects where conventional UT is limited.
• Digital noise removal simplifies defect recognition in the display window.
• On-image scale and distance-measure tools for direct dimensional analysis.
• Optional Optical Zoom Set: approximately twofold reduction in minimum detectable defect size (from ~1 mm to ~0.5 mm), with laser optical axis adjustment for improved irradiation uniformity.
• User-friendly software for marking and measuring defects from images/videos.

Applications / Industries
Used in R&D and quality inspection for multi-material assemblies where detection of near-surface defects (~1 mm) is required. Particularly relevant for bonded joints, layered or coated components, and structures where weight and strength optimization demand reliable near-surface inspection.

Technical specifications

• Brand: Shimadzu
• Model: MIV-X
• Imaging principle: Ultrasonic oscillator combined with stroboscopic optical detection (proprietary light imaging)
• Visualization depth: near-surface defects at about 1 mm depth
• Standard minimum detectable flaw size: approximately 1 mm diameter
• Optional Optical Zoom: reduces minimum detectable flaw size to approximately 0.5 mm diameter
• Functions: digital noise removal, marking tools, on-image scale (ruler), distance measurement
• Operation: attach ultrasonic oscillator to sample, position camera above inspection surface, observe ultrasonic wave propagation as video/images
• Inspection targets: cracks, voids, delamination, adhesive/bond peeling, paint and thermal-spray coatings, joints in multi-materials
• Non-destructive inspection technique
• Intended for research use; not for diagnostic medical procedures