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Micro Vickers hardness tester DUH-210benchtopfor rubberfor semiconductors
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Characteristics
- Type
- micro Vickers
- Mounting
- benchtop
- Product applications
- for rubber, for semiconductors, for plastics, for ceramics
- Other characteristics
- computerized, with data logger, low-load, micro
Description
Overview
A measurement system for evaluating material properties of micro regions (semiconductors, LSI, ceramics, hard disks, vapor-deposited films and thin coatings) and for hardness assessment of plastics and rubbers. The instrument records dynamic indentation depth during loading rather than the residual indentation after test, enabling measurement of very thin films and surface/treatment layers. The dynamic data also provide values required to calculate the elastic modulus of specimens.
Features
Downloads (selected)
Applications (selected)
Technical specifications
A measurement system for evaluating material properties of micro regions (semiconductors, LSI, ceramics, hard disks, vapor-deposited films and thin coatings) and for hardness assessment of plastics and rubbers. The instrument records dynamic indentation depth during loading rather than the residual indentation after test, enabling measurement of very thin films and surface/treatment layers. The dynamic data also provide values required to calculate the elastic modulus of specimens.
Features
- Evaluation of hardness and material parameters in accordance with standards (ISO 14577-1 Annex A)
- High-precision evaluation of elastic modulus
- Low test force capability with measurement resolution of 0.196 μN
Downloads (selected)
- Recycled Plastic Analysis Solutions (brochure, PDF)
- DUH-211/211S - Dynamic Ultra Micro Hardness Testers (brochure, PDF)
- Instruments for Evaluating Electronic Devices (brochure, PDF)
- Instruction Manual (PDF)
- Software Instruction Manual (PDF)
Applications (selected)
- Evaluation of changes in physical properties of recycled plastics processed by advanced recycling methods (case studies)
- Application examples on degraded or simulated degraded polypropylene and recycled polyethylene
- Material characterization for thin films, coatings and device surfaces in semiconductor and electronics R&D
Technical specifications
- Model: DUH-210/DUH-210S (Dynamic Ultra Micro Hardness Tester)
- Measurement method: dynamic measurement of indentation depth during indentation (not post-indentation)
- Data output suitable for calculation of elastic modulus of test specimens
- Standards: evaluation in accordance with ISO 14577-1 (Annex A)
- Measurement resolution: 0.196 μN (low-force capability)
- Typical applications: semiconductors, LSI, ceramics, hard disks, vapor-deposited films, thin coating layers, plastics, rubbers
- Enables measurement of very thin films and surface/treatment layers not measurable by conventional hardness testers
Catalogs
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.