Product overviewThe FUTURESES H64M is a miniature uniaxial piezoresistive (MEMS) accelerometer with a voltage output, developed for crash and high-impact tests where minimal mass loading and a wide frequency range are required. It offers selectable measurement ranges and is optimized for high shock resistance and broad dynamic response.
Key features- Sensor type: analog uniaxial accelerometer
- Sensor technology: piezoresistive (MEMS-based Wheatstone bridge)
- Output signal: voltage
- Selectable measurement ranges: ±50, ±100, ±200, ±500, ±2000, ±6000 g
- Frequency response: DC to 7000 Hz
- Shock resistance: up to 10,000 g
TechnologyH64M sensors use MEMS-based piezoresistive elements arranged as a Wheatstone bridge. This configuration ensures stable analog voltage output across a wide dynamic range and allows accurate measurement from DC up to 7 kHz while maintaining high impact tolerance.
Housing and optionsMultiple configuration options are available, including different integrated cable lengths, selectable connectors and the option to integrate a Dallas DS2401 identification chip. Mechanical and electrical interfaces can be adapted to test rig requirements.
Applications- Automotive crash testing and instrumentation
- Impact and high-acceleration measurement tasks
- Test setups requiring minimal sensor mass to avoid altering dynamics
- Measurements compliant with SAE J211 impact test instrumentation
Environmental- Operating temperature range: -40°C to +120°C
Technical specifications- Sensor type: Accelerometer (analog)
- Sensor technology: Piezoresistive (MEMS, Wheatstone bridge)
- Number of sensitive directions: Uniaxial
- Output signal: Voltage
- Measurement ranges: ±50 g, ±100 g, ±200 g, ±500 g, ±2000 g, ±6000 g
- Frequency response: DC to 7000 Hz
- Impact / shock resistance: up to 10,000 g
- Temperature range: -40°C to +120°C
- Housing / options: configurable cable length, selectable connectors, optional Dallas DS2401 chip
- Standards: SAE J211 (impact test instrumentation)
- Design: miniaturized, lightweight for minimal mass loading in tests