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Optical inspection system AIVR 7μ
digitalvideo visioncamera

Optical inspection system - AIVR 7μ - CIMS - digital / video vision / camera
Optical inspection system - AIVR 7μ - CIMS - digital / video vision / camera
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Characteristics

Technology
camera, optical, digital, AI, video vision
Operational mode
automated
Type
quality, for defect detection, visual, video
Applications
for the electronics industry
Product applications
for wafers
Other characteristics
high-resolution, computer-controlled, non-contact

Description

Product description
AI-powered AOI verification workstation combining virtual and physical verification in a single station. AIVR 7μ is built for high-volume manufacturing of IC substrates and is optimized for verification of 7–25 µm line/space technologies. In AIVR mode, operators review AOI-captured defect images enhanced by AI algorithms to quickly filter obvious false calls and prioritize true defects. The system integrates verification results with the production database and supports operator classification via an optional touchscreen for immediate QA feedback.

Highlights
  • Combines verification of AOI post-processed images with live video mode
  • Up to 90% increase in verification efficiency versus traditional mode
  • Displays AI-enhanced high-resolution color defect images from AOI
  • Variable zoom and automated calibration
  • Stationary vacuum table for stable handling
  • Ergonomic workstation design
  • Clear defect imaging with adjustable video illumination

Options
  • Auto-marker for marking defects
  • Barcode reader
  • Adjustable monitor arm
  • CDB™/CDBIC™ — defect classification and virtual defect mapping
  • SharpLight™ — enhanced video imaging

Compatibility and operation
Operates as a verification workstation integrated with AOI systems. AI-based image enhancement assists rapid filtering of false calls and supports classification workflows. Optional touchscreen enables operator classification and immediate feedback to QA systems; results integrate with the production database.

Technical specifications
  • Model name: AIVR 7μ
  • Application: AOI verification workstation for IC substrates
  • Supported line/space technology: optimized for 7–25 µm, minimum down to 7 µm
  • Verification modes: AOI post-processed image verification and live video mode
  • Image features: AI-enhanced high-resolution color defect images
  • Optics/controls: Variable zoom, automated calibration, adjustable video light
  • Mechanical: Stationary vacuum table, ergonomic design
  • Integration: Compatible with all CIMS AOI; results integrate with database
  • Optional modules: Auto-marker, barcode reader, adjustable monitor arm, CDB™/CDBIC™, SharpLight™

Other CIMS products

PCB Inspection and Metrology

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.