XRF spectrometer EA-XF3500X

X-ray fluorescencefor the building industryfor the mining industry

Main usage
The EA-XF3500 X-ray fluorescence analyzer excites samples with X‑rays and detects the resulting characteristic X‑rays to deliver qualitative and quantitative results for silicon and aluminum. It is designed for industrial applications such as metallurgy, mining and building materials, and is commonly used in cement plants to measure SiO2 and Al2O3 contents in raw materials, clinker, limestone and clay.

Main features

• Integrated microcomputer design with compact footprint and industrial finish.
• Large LCD screen with an English menu interface for straightforward operation.
• Fast analysis: percentage results for SiO2 and Al2O3 available in 60 s (typical).
• Non-destructive measurement: samples remain intact and can be re-tested.
• No chemical reagents or radioactive source required; low power consumption and no emissions.
• Extensive data storage with queryable measurement results and instrument self-check logs.
• Conforms to GB/T19140 (general principles of cement X-ray fluorescence analysis).

Technical indicators

• Analysis range: SiO2, Al2O3 0.01%–100%.
• Analysis precision (std. dev.): SiO2 ≤ 0.10%; Al2O3 ≤ 0.08%.
• Analysis width: (max − min) ≤ 15% for a given element (example: raw material SiO2 range 10%–25%, calibrated accordingly).
• Analysis time: n × 60 s (n = 1–5).
• Operating conditions: AC 200V–240V; ambient temperature 0–40℃; relative humidity <85% (at 30℃).
• Overall power consumption: <30 W.
• Dimensions (W×D×H): 468 × 368 × 136 mm.
• Weight: 13.8 kg.

Technical specifications

• Model / SKU: EA-XF3500
• Measured elements: Silicon (SiO2) and Aluminum (Al2O3)
• Measurement range: 0.01%–100%
• Precision (std. dev.): SiO2 ≤ 0.10%; Al2O3 ≤ 0.08%
• Typical analysis time: 60 s (configurable up to 5 × 60 s)
• Power supply: AC 200V–240V
• Power consumption: <30 W
• Operating temperature: 0–40℃; Relative humidity: <85% (at 30℃)
• Dimensions (W×D×H): 468 × 368 × 136 mm
• Weight: 13.8 kg