Optical imaging analysis system JX

2D

Overview
The metallographic image analysis system provides quantitative metallography workflows for laboratory and industrial inspection. Developed by materials science experts, the software performs real-time image processing, automated comparison, defect detection, grading, statistical analysis and illustrated report generation. The solution integrates advanced image analysis with metallurgical microscopy to deliver fast, standards‑compliant results and supports customization for specific materials and assessment criteria. The system uses a clear Chinese‑language interface and is designed for quick operator training and broad adoption.

Main functions

• Image acquisition and storage, plus image editing (crop, rotate, annotations)
• Image processing: enhancement, filtering, overlay and stitching
• Comprehensive measurement tools: perimeter, area, percent fraction and dozens of additional metrics
• Grain size measurement and rating with grain boundary extraction and reconstruction (single‑phase and dual‑phase)
• Non‑metallic inclusion detection and grading (sulfides, oxides, silicates, etc.)
• Pearlite, ferrite and graphite spheroidization rate measurement and grading
• Decarburized/carburized layer and surface coating thickness measurement
• Weld penetration and fusion depth measurement
• Phase–area measurement for ferritic and austenitic stainless steels
• Built‑in metallographic atlas with nearly 470 common material images; new materials and evaluation standards can be customized

System composition

• Software (delivered on CD)
• Hardware protection: USB dongle
• 3‑megapixel HD digital camera
• 0.5× adapter lens interface
• Image micrometer scale, graduation 0.01 mm

Hardware operating environment
Windows 7 (32/64‑bit). Microsoft Office 2007/2010 supported.

Minimum system requirements

• CPU: Intel Core 2 2.8 GHz or higher
• Memory: 2 GB or more
• USB: USB 2.0 or USB 3.0
• Display: 19 inches or larger
• CD‑ROM drive

Technical specifications

• Quantitative metallographic image analysis with real‑time comparison, inspection, grading, statistical evaluation and illustrated reporting
• Compliant with national and international standards (GB, JB, YB, HB, QC, DL, DJ, ASTM, etc.)
• Extensive measurement capabilities: perimeter, area, percent content and dozens of other tools
• Automated grain boundary extraction and reconstruction for accurate grain size rating
• Inclusion detection and grading for sulfides, oxides, silicates and similar defects
• Measurement and grading of pearlite, ferrite and graphite spheroidization
• Functions for decarburized/carburized layer measurement, coating thickness and weld penetration
• Phase–area support for ferritic and austenitic stainless steels
• Built‑in atlas: ~470 material micrographs; customizable database for new materials and standards
• Delivered with USB dongle protection, software CD and recommended camera/interface (3 MP camera, 0.5× adapter, 0.01 mm micrometer scale)
• Minimum PC requirements restated: Intel Core 2 2.8 GHz+, 2 GB RAM, USB 2.0/3.0, 19"+ display, CD‑ROM