Wavelength-sensitive photodiode C30737LH-500-80N
siliconavalancheinfrared

Wavelength-sensitive photodiode - C30737LH-500-80N - Excelitas Technologies - PCO - silicon / avalanche / infrared
Wavelength-sensitive photodiode - C30737LH-500-80N - Excelitas Technologies - PCO - silicon / avalanche / infrared
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Characteristics

Type
wavelength-sensitive, silicon, avalanche, infrared, LIDAR
Mounting
chip on carrier, SMD

Description

Description: The C30737LH-500-80N silicon avalanche photodiode (Si APD) features a 500 µm active diameter and an enhanced spectral response around 800 nm. Supplied in a leadless ceramic carrier (LCC), it is designed for fast detection and high responsivity across the visible to near-infrared range.

Key Features:
  • High responsivity from 500 nm to 1000 nm
  • Low noise with extremely fast rise times; frequency response above 1.3 GHz
  • 500 µm active diameter, optimized for peak sensitivity at 800 nm
  • Leadless ceramic carrier option ("LH") for compact surface-mount compatibility


Applications:
  • LiDAR systems
  • Laser range-finding
  • Security and scanning instrumentation
  • Cost-sensitive applications requiring a high-performance photodetector


Technical specifications:
  • Active Diameter: 500 µm
  • Peak Sensitivity Wavelength: 800 nm
  • Breakdown Voltage Vbd: 120–210 V (binning available)
  • Temperature Coefficient of Vop for Constant M: 0.5 V/°C
  • Gain: 100 at 800 nm
  • Responsivity: 50 A/W at 800 nm
  • Dark Current Id: 0.1–1 nA
  • Noise Current: 0.1 pA/√Hz
  • Capacitance: 2 pF
  • Rise/Fall Time: 0.3 ns (R load = 50 Ω)
  • Cut-off Frequency: 1.3 GHz
  • Storage Temperature: -50 °C to +100 °C
  • Operating Temperature: -40 °C to +85 °C
  • Package: 3 x 3 mm glass window, leadless ceramic carrier (LCC)
  • Window: Standard

Catalogs

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Exhibitions

Meet this supplier at the following exhibition(s):

electronica Munich 2026
electronica Munich 2026

10-13 Nov 2026 Munich (Germany) Hall B4 - Stand 302

  • More information

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